Three-dimensional imaging and tilt-angle analysis of dislocations in 4H-SiC by two-photon-excited band-edge photoluminescence
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2015 ◽
Vol 821-823
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pp. 343-346
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1995 ◽
Vol 177
(2)
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pp. 128-137
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2013 ◽
Vol 70
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pp. 143-145
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2009 ◽
Vol 234
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pp. 196-204
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2001 ◽
Vol 158
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pp. 49-55
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