Three-Dimensional Imaging of Extended Defects in 4H-SiC by Two-Photon-Excited Band-Edge Photoluminescence
2015 ◽
Vol 821-823
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pp. 343-346
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This paper demonstrates three-dimensional imaging of threading screw dislocations (TSDs) and threading edge dislocations (TEDs) in 4H-SiC using two-photon-excited photoluminescence (2PPL) band-edge emission. Three-dimensional (3D) images of TSDs and TEDs are successfully obtained as dark contrasts on a bright background of band-edge emission. The intensity inversion of a 2PPL 3D image yields a perspective to visually examine the propagation behavior of dislocations. The tilt angles of TEDs are also measured and shown to correlate with the directions of the extra half planes of TEDs.
2016 ◽
Vol 858
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pp. 361-366
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2014 ◽
Vol 778-780
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pp. 338-341
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1995 ◽
Vol 177
(2)
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pp. 128-137
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2013 ◽
Vol 70
(2)
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pp. 143-145
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2017 ◽
Vol 705
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pp. 492-496
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