Analysis of Within-Die Complementary Metal–Oxide–Semiconductor Process Variation with Reconfigurable Ring Oscillator Arrays Using HiSIM
2011 ◽
Vol 50
(4)
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pp. 04DE05
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2017 ◽
Vol 9
(15)
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pp. 13262-13268
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2008 ◽
Vol 47
(2)
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pp. 1147-1151
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