Synthesis and nanorod growth of n-type phthalocyanine on ultrathin metal films by chemical vapor deposition

2016 ◽  
Vol 55 (3S2) ◽  
pp. 03DD07 ◽  
Author(s):  
Yasuko Koshiba ◽  
Mihoko Nishimoto ◽  
Asuka Misawa ◽  
Masahiro Misaki ◽  
Kenji Ishida
MRS Advances ◽  
2020 ◽  
Vol 5 (31-32) ◽  
pp. 1681-1685
Author(s):  
Yoshiyuki Seki ◽  
Yutaka Sawada ◽  
Hiroshi Funakubo ◽  
Kazuhisa Kawano ◽  
Noriaki Oshima

AbstractMetal Ir films were prepared by spray chemical vapor deposition (CVD) in air from an Ir precursor, (1,3-cyclohexadiene)(ethylcyclopentadienyl)iridium, Ir(EtCp)(CHD). Film deposition was ascertained at 270–430°C on a SiO2/Si substrate and the deposition rate increased with the deposition temperature but was saturated above 330°C. The obtained films consisted of Ir metal without any iridium oxide impurity irrespective of the deposition temperature. Films tended to orient to (111) with increasing deposition temperature. Resistivity of these Ir films decreased with increasing film thickness and reached to values on the order of 10-6 Ω・cm, which was the same order of the values for bulk Ir metal. Good step coverage was observed for the Ir metal films deposited at 270°C and 330°C. This shows that the simple spray CVD process in air is a good candidate for depositing Ir metal films with good conductivity and step coverage.


1989 ◽  
Vol 168 ◽  
Author(s):  
David C. Smith ◽  
Steve G. Pattillo ◽  
Norman E. Elliott ◽  
Thomas G. Zocco ◽  
Carol J. Burns ◽  
...  

AbstractLow-temperature chemical vapor deposition of M(allyl)3 (M = Rh, Ir; allyl = η3 -C3H5) in the presence of H• yields thin, crystalline metal films of greater than 97% metal composition. Depositions using H2 result in the formation of materials which are amorphous and contain a significant amount of residual carbon (14%). The composition of these materials does not differ significantly from that obtained from the vacuum thermal deposition of M(allyl)3.


2021 ◽  
Vol 2 (4) ◽  
pp. 100410
Author(s):  
Shuaishuai Xu ◽  
Lipeng Zhang ◽  
Bin Wang ◽  
Rodney S. Ruoff

2021 ◽  
Vol 2 (3) ◽  
pp. 100372
Author(s):  
Shuaishuai Xu ◽  
Lipeng Zhang ◽  
Bin Wang ◽  
Rodney S. Ruoff

Author(s):  
J. L. Kenty

An AEI EM6 electron microscope was modified for the in situ chemical vapor deposition (CVD) of Si films by pyrolysis of SiH4 gas. The environmental cell was so constructed that 100 μm dia. apertures placed 1.6 mm apart formed the top and bottom of the CVD microchamber and permitted a gas flow of up to 0.4 cm3 (STP)/min at up to 10 torr. A current of 2 amps through a single 200 mesh Ti grid of 0.003 mm2 net cross sectional area is sufficient to heat the sample to ~1200°C. Some temperature-heater power calibration experiments were performed by observing the melting point of evaporated metal films.


2013 ◽  
Vol 25 (22) ◽  
pp. 4566-4573 ◽  
Author(s):  
Jason P. Coyle ◽  
Peter G. Gordon ◽  
Adam P. Wells ◽  
David J. Mandia ◽  
Eric R. Sirianni ◽  
...  

1988 ◽  
Vol 131 ◽  
Author(s):  
Herbert D. Kaesz ◽  
R. Stanley Williams ◽  
Robert F. Hicks ◽  
Yea-Jer Arthur Chen ◽  
Ziling Xue ◽  
...  

ABSTRACTA variety of transition-metal films have been grown by organometallic chemical vapor deposition (OMCVD) at low temperatures using hydrocarbon or hydrido-carbonyl metal complexes as precursors. The vapors of the metal complexes are transported with argon as the carrier gas, adding H2 to the stream shortly before contact with a heated substrate.High-purity platinum films have been grown using (η5−C5H5)PtMe3 [1] or (η5−CH3C5H4)PtMe3 [2] at substrate temperatures of 180°C or 120°C, respectively. The incorporation of a methyl substituent on the cyclopentadienyl ligand decreases the melting point of the organoplatinum complex from 106°C [1] to 30°C [2] and increases the vapor pressure substantially. Film deposition also occurs at a lower substrate temperature. Analyses by X-ray diffraction (XRD), Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) indicate that the films are well crystallized and do not contain any observable impurities after sputter cleaning.The substrate temperatures for the first appearance of other transition-metal films from organometallic precursors are as follows (°C): Rh(η3−C3H5)3 (120/Si), Ir(η3-C3H5)3 (100/Si), HRe(CO)5 (130/Si) and Ni(η5−CH3C5H4)2 (190/glass, 280/Si). These films are essentially amorphous and contain trace oxygen impurities (< 2%), except for the Re film, which was 10% oxygen and 20%carbon.


2006 ◽  
Vol 200 (10) ◽  
pp. 3347-3350 ◽  
Author(s):  
Yuzuru Ogura ◽  
Chikako Kobayashi ◽  
Yoshiyuki Ooba ◽  
Naoki Yahata ◽  
Hitoshi Sakamoto

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