In situ Chemical Vapor Deposition of Silicon
1974 ◽
Vol 32
◽
pp. 488-489
An AEI EM6 electron microscope was modified for the in situ chemical vapor deposition (CVD) of Si films by pyrolysis of SiH4 gas. The environmental cell was so constructed that 100 μm dia. apertures placed 1.6 mm apart formed the top and bottom of the CVD microchamber and permitted a gas flow of up to 0.4 cm3 (STP)/min at up to 10 torr. A current of 2 amps through a single 200 mesh Ti grid of 0.003 mm2 net cross sectional area is sufficient to heat the sample to ~1200°C. Some temperature-heater power calibration experiments were performed by observing the melting point of evaporated metal films.