Low Frequency Noise and Mobility Correlation from RT to Low Temperatures for n-Channel Ge MOSFETs

2015 ◽  
Author(s):  
S. Ghosh ◽  
P. Bhatt ◽  
Y. Tiwari ◽  
S. Lodha
Keyword(s):  
Low Temperatures ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

scholarly journals Si vertical JFET at low temperatures ; I-V characteristics and low frequency noise

1994 ◽  
Vol 04 (C6) ◽  
pp. C6-87-C6-91
Author(s):  
J. A. Chroboczek ◽  
A. Granier ◽  
R. Plana ◽  
J. Graffeuil
Keyword(s):  
Low Temperatures ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

Low frequency noise in 100 nm n-MOSFET's at low temperatures

1991 ◽  
Vol 15 (1-4) ◽  
pp. 543-546
Author(s):  
Z.M. Shi ◽  
J.-P. Miéville ◽  
J. Barrier ◽  
M. Dutoit
Keyword(s):  
Low Temperatures ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

scholarly journals Dark current and 1/f noise in forward biased InAs photodiodes

2021 ◽  
Vol 24 (04) ◽  
pp. 466-471
Author(s):  
V.V. Tetyorkin ◽  
◽  
A.V. Sukach ◽  
A.I. Tkachuk ◽  
◽  
...  
Keyword(s):  
Dark Current ◽  
Low Temperatures ◽  
Transport Mechanism ◽  
Low Frequency ◽  
Depletion Region ◽  
Charge Carriers ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Forward Current ◽  
Carrier Tunneling

Dark current and low-frequency noise have been studied in forward biased InAs photodiodes within the temperature range 77…290 K. Photodiodes were fabricated by diffusion of Cd into n-InAs single crystal substrates. It has been shown that, at the temperatures >130 K, the forward current is defined by recombination of charge carriers with participation of deep states in the middle of band gap. At these temperatures, a correlation is found between forward current and 1/f noise. At lower temperatures, the forward current and noise have been analyzed within the model of inhomogeneous p-n junction caused by dislocations in the depletion region. The experimental evidence has been obtained that multiple carrier tunneling is the main transport mechanism at low temperatures, which leads to an increase in low-frequency noise.

Estimating the Quality of Thermionic Cathodes for Microwave Vacuum Tubes Using the Low-Frequency Noise Parameters

Vestnik MEI ◽  
2018 ◽  
Vol 5 (5) ◽  
pp. 120-127
Author(s):  
Mikhail D. Vorobyev ◽  
◽  
Dmitriy N. Yudaev ◽  
Andrey Yu. Zorin ◽  
◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Parameters ◽  
Thermionic Cathodes ◽  
Vacuum Tubes

Simulation of Low Frequency Noise in a CCTWT

1999 ◽  
Author(s):  
Charles K. Birdsall ◽  
J. P. Varboncoeur ◽  
P. J. Christensen
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

Impacts of low-frequency noise from industrial sources in residential areas

2021 ◽  
Vol 182 ◽  
pp. 108203
Author(s):  
Lígia T. Silva ◽  
Alda Magalhães ◽  
José Ferreira Silva ◽  
Fernando Fonseca
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Residential Areas ◽  
Industrial Sources
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