scholarly journals VISUAL ANALYTICS FOR EVALUATION OF VALUE IMPACT IN ENGINEERING DESIGN

Author(s):  
Timoleon Kipouros ◽  
Ola Isaksson
Author(s):  
Xin Yan ◽  
Mu Qiao ◽  
Timothy W. Simpson ◽  
Jia Li ◽  
Xiaolong Luke Zhang

During the process of trade space exploration, information overload has become a notable problem. To find the best design, designers need more efficient tools to analyze the data, explore possible hidden patterns, and identify preferable solutions. When dealing with large-scale, multi-dimensional, continuous data sets (e.g., design alternatives and potential solutions), designers can be easily overwhelmed by the volume and complexity of the data. Traditional information visualization tools have some limits to support the analysis and knowledge exploration of such data, largely because they usually emphasize the visual presentation of and user interaction with data sets, and lack the capacity to identify hidden data patterns that are critical to in-depth analysis. There is a need for the integration of user-centered visualization designs and data-oriented data analysis algorithms in support of complex data analysis. In this paper, we present a work-centered approach to support visual analytics of multi-dimensional engineering design data by combining visualization, user interaction, and computational algorithms. We describe a system, Learning-based Interactive Visualization for Engineering design (LIVE), that allows designer to interactively examine large design input data and performance output data analysis simultaneously through visualization. We expect that our approach can help designers analyze complex design data more efficiently and effectively. We report our preliminary evaluation on the use of our system in analyzing a design problem related to aircraft wing sizing.


Author(s):  
Michael T. Postek

The term ultimate resolution or resolving power is the very best performance that can be obtained from a scanning electron microscope (SEM) given the optimum instrumental conditions and sample. However, as it relates to SEM users, the conventional definitions of this figure are ambiguous. The numbers quoted for the resolution of an instrument are not only theoretically derived, but are also verified through the direct measurement of images on micrographs. However, the samples commonly used for this purpose are specifically optimized for the measurement of instrument resolution and are most often not typical of the sample used in practical applications.SEM RESOLUTION. Some instruments resolve better than others either due to engineering design or other reasons. There is no definitively accurate definition of how to quantify instrument resolution and its measurement in the SEM.


2018 ◽  
Vol 1 (2) ◽  
Author(s):  
Matthew D. Doerfler ◽  
◽  
Katie N. Truitt ◽  
Mark J. Fisher ◽  
Grant Theron ◽  
...  

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