The detrimental effect of AlGaN barrier quality on carrier dynamics in AlGaN/GaN interface

Carrier recombination and scattering at the semiconductor boundaries can substantially limit the device efficiency. However, surface and interface recombination is generally neglected in the nitride-based devices. Here, we study carrier recombination and diffusivity in AlGaN/GaN/sapphire heterointerfaces with AlGaN barriers of different quality. We employ the light induced transient grating and time-resolved photoluminescence spectroscopy techniques to extract carrier lifetime in different depths of the GaN buffer as well as in the AlGaN barrier, and to evaluate the carrier diffusion coefficient in the buffer. Moreover, we assess interface recombination velocity, Shockley-Read-Hall and radiative recombination rates. We reveal the adverse barrier influence on carrier dynamics in the underlying buffer: AlGaN barrier accelerates the nonradiative carrier recombination in the GaN buffer. The interface recombination velocity in the GaN buffer increases with decreasing AlGaN barrier quality, and the dominating recombination mechanism switches from Shockley-Read-Hall to interface recombination. These phenomena are governed by a cumulative effect of various interface-deteriorating barrier defects. Meanwhile, the carrier diffusivity in the GaN buffer is not affected by the AlGaN barrier. We conclude that barrier-accelerated interface recombination can become a major carrier loss mechanism in AlGaN/GaN interface, and may substantially limit the efficiency in nitride-based UV LEDs.

Evaluation of recombination losses in thin film solar cells using an LED sun simulator − the effect of RbF post-deposition on CIGS solar cells

Distinguishing among different electrical loss mechanisms − such as interface and bulk recombination − is a common problem in thin film solar cells. In this work, we report a J–V measurement technique using different illuminating spectra to distinguish between these two recombination losses. The basic idea is to change the relative contribution of bulk recombination to the total losses of photo-generated charge carriers by generating them in different depths within the absorber layer using different spectral regions of the illuminating light. The use of modern LED sun-simulators allows an almost free design of illumination spectra at intensities close to 1 sun. The comparison of two simple J–V measurements, one recorded with illumination near the absorber's band-gap energy and one with light of higher energy, in combination with supporting measurements of the absorber properties, as well as device modeling, enables the extraction of the diffusion length and the interface recombination velocity. Using this technique, we show that in CIGS solar cells, an RbF post-deposition treatment does not only reduce interface recombination losses, as often reported, but also reduces bulk recombination in the CIGS absorber. Furthermore, we find that both cells, with and without RbF treatment, are dominantly affected by interface recombination losses.