error robustness
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IEEE Access ◽  
2021 ◽  
pp. 1-1
Author(s):  
Hiroki Iimori ◽  
Giuseppe Thadeu Freitas De Abreu ◽  
Omid Taghizadeh ◽  
Razvan-Andrei Stoica ◽  
Takanori Hara ◽  
...  

2017 ◽  
Vol 2017 ◽  
pp. 1-9 ◽  
Author(s):  
Wenxing Li ◽  
Yu Zhao ◽  
Qiubo Ye ◽  
Bin Yang

An approach for null broadening beamforming is proposed based on adaptive variable diagonal loading (VDL) and combined with the covariance matrix taper (CMT) approach, aiming at improving the robustness of adaptive antenna null broadening beamforming when array calibration error exists. Hence, it is named VDL-CMT. In this novel approach, the signal-to-noise ratio in the tapered sample covariance matrix is estimated and the VDL factor can be obtained adaptively. Then, the covariance matrix of the CMT approach is loaded with the obtained VDL factor. According to simulation results, in the case of array calibration error, robustness of the VDL-CMT is significantly improved and its performance is better than that of the existing adaptive antenna null broadening beamforming approaches.


2016 ◽  
Vol 25 (12) ◽  
pp. 1650163 ◽  
Author(s):  
Bingbing Xia ◽  
Jun Wu ◽  
Hongjin Liu ◽  
Kai Zhou ◽  
Zhifu Miao

With the need for fast and low-power radiation-hardened processors, advanced technology process is applied to obtain both high performance as well as high reliability. However, scaling down of the size of the transistor makes the transistor sensitive to outside disturbances, such as soft error introduced by the strikes of the cosmic neutron beams. Besides aerospace applications, such reliability should also be taken into consideration for the sub-100[Formula: see text]nm CMOS designs to ensure the robustness of the circuit. In such circumstances, several radiation-hardened flip-flops are designed and simulated under SMIC 40[Formula: see text]nm process. Simulation results show that with five aspects (performance, power, area, PVT variation and reliability) taken into consideration, TSPC-based DICE and TMR combined architecture has the best soft-error robustness in comparison with other radiation-hardened flip-flops, and the critical charge of such architecture is 490[Formula: see text]fC, which is 12.5X higher than the traditional unhardened flip-flop.


2013 ◽  
Vol 40 (6Part32) ◽  
pp. 531-531
Author(s):  
E Ehler ◽  
P Higgins ◽  
K Dusenbery
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