Automation of procedure for diagnostics of thin film electroluminescent indicators’ structure

Problems of measurement automation for creating a testing system are considered. This system accelerates the process of parameters controlling in the production and development of new samples of indicator (display) technology. The main parameters of the indicators are defined, the tasks of automation of measuring processes are indicated, the hardware and software structure of the system is developed. The main features of an integrated approach to solve the problems of automating the process of testing the structures of thin-film electroluminescent indicators were proposed, the parameters of thin-film electroluminescent indicators were considered as the basis for forming the composition of an automated testing complex, and the automation of processing the experimental results at the software level was described. The ideas outlined in this article make it possible to formulate a technical task for the development of a complex for automated measurement of the parameters of thin-film electroluminescent elements, as well as its components and software.

Deep learning and 3D optical metrology improve complex feature detection and ranking

With the increasing need of measurement automation in many industrial sectors, 3D optical metrology is now required to integrate options like surface feature detection and classification that were previously performed by visual inspectors. The recent combination of deep learning algorithms with 3D optical metrology improves characterization and classification of complex surfaces.