cumulative exposure model
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2018 ◽  
Vol 55 (4) ◽  
pp. 1014-1024 ◽  
Author(s):  
Maxim Finkelstein ◽  
Nil Kamal Hazra ◽  
Ji Hwan Cha

Abstract We consider an open problem of obtaining the optimal operational sequence for the 1-out-of-n system with warm standby. Using the virtual age concept and the cumulative exposure model, we show that the components should be activated in accordance with the increasing sequence of their lifetimes. Lifetimes of the components and the system are compared with respect to the stochastic precedence order and its generalization. Only specific cases of this optimal problem were considered in the literature previously.


Author(s):  
Qiguo Hu ◽  
Jinyin He

The modeling of phased-mission systems is difficult and the solving process is complex because of the relevance of the phase tasks and the sharing of components existing in different phases or between phases. To solve the problem, based on the cumulative exposure model, the path sets combination method of phased-mission systems is proposed. Aiming at the problem of the cross-stage correlation of components and its different failure rate in each phase, the cumulative exposure model considering the historical damage of components is used to solve by obtaining the cumulative damage distribution of each component in each phase. Firstly, a phased-mission systems reliability model is build by mapping phased-mission system fault trees into a Bayesian network. By traversing the Bayesian network, the minimal path sets of each phase are obtained. Secondly, the disjoint formulas introduced by variable elimination method are used to do the disjoint operation of the minimal path sets of each phase and the conditional probability relations of the common components are used to reduce the minimal path sets scale. Finally, the minimum disjoint path sets of each phase are combined and summed according to the component conditional probability relation. The path sets combination method of phased-mission systems avoids the large conditional probability table, large storage and large computation problems caused by the excessive discrete states in the traditional Bayesian method and the problem that the PMS-BDD method has strict requirements for variable ordering and is difficult to solve the system reliability with multiple failure distribution types of components. In the end, a phased-mission systems reliability modeling and solving is carried out for a geosynchronous orbit satellite, and compared with the PMS-BDD method, which verifies the correctness of the method.


2016 ◽  
Vol 31 (3) ◽  
pp. 311-329 ◽  
Author(s):  
Maxim Finkelstein ◽  
Nil Kamal Hazra

We study the allocation strategies for redundant components in the load-sharing series/parallel systems. We show that under the specified assumptions, the allocation of a redundant component to the stochastically weakest (strongest) component of a series (parallel) system is the best strategy to achieve its maximal reliability. The results have been studied under cumulative exposure model and for a general scenario as well. They have a clear intuitive meaning; however, the corresponding additional assumptions are not obvious, which can be seen from the proofs of our theorems.


2016 ◽  
Vol 38 (1) ◽  
Author(s):  
Abedel-Qader Al-Masri ◽  
Mohammed Al-Haj Ebrahem

In this paper we assume that the life time of a test unit follows a log-logistic distribution with known scale parameter. Tables of optimum times of changing stress level for simple step-stress plans under a cumulative exposure model are obtained by minimizing the asymptotic variance of the maximum likelihood estimator of the model parameters at the design stress with respect to the change time.


2015 ◽  
Vol 32 (8) ◽  
pp. 906-920 ◽  
Author(s):  
Firoozeh Haghighi

Purpose – The purpose of this paper is to design a simple step-stress model under type-I censoring when the failure time has an extension of the exponential distribution. Design/methodology/approach – The scale parameter of the distribution is assumed to be a log-linear function of the stress and a cumulative exposure model is hold. The maximum likelihood estimates of the parameters, as well as the corresponding Fisher information matrix are derived. Two real examples are given to show the application of an extension of the exponential distribution in reliability studies and a numerical example is presented to illustrate the method discussed here. Findings – A simple step-stress test under cumulative exposure model and type-I censoring for an extension of the exponential distribution is presented. Originality/value – The work is original.


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