compositional stresses
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2019 ◽  
Vol 11 (33) ◽  
pp. 191-196 ◽  
Author(s):  
Sunil Mandowara ◽  
Brian Sheldon

2017 ◽  
Vol 19 (19) ◽  
pp. 12206-12220 ◽  
Author(s):  
Jay Sheth ◽  
Di Chen ◽  
Harry L. Tuller ◽  
Scott T. Misture ◽  
Sean R. Bishop ◽  
...  

In-situ wafer curvature and x-ray diffraction measurements were employed to investigate the grain size dependence of stress and strain in Pr doped ceria thin films.


2008 ◽  
Vol 91 (12) ◽  
pp. 3986-3993 ◽  
Author(s):  
Sidharth Bhatia ◽  
Brian W. Sheldon

2000 ◽  
Vol 84 (11) ◽  
pp. 2449-2452 ◽  
Author(s):  
B. J. Spencer ◽  
P. W. Voorhees ◽  
J. Tersoff

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