TOF mass spectra of zircon M257 measured by VUV laser desorption ionization

We developed a method to measure the time-of-flight (TOF) mass spectra of zircon M257 based on our significantly improved VUV laser desorption/ionization (VUVDI) mass spectrometer. The zircon sample embedded in...

Crystal Chemistry and Structural Variations for Zircon Samples from Various Localities

This study investigates the variations of structural parameters and chemistry of a partially metamict and seven detrital zircon samples from different localities using single-crystal X-ray diffraction, synchrotron high-resolution powder X-ray diffraction, and electron-probe micro-analysis techniques. The unit-cell parameters for the eight zircon samples vary linearly with increasing unit-cell volume, V. A zircon sample from the Canadian Arctic Islands has the smallest unit-cell parameters, bond distances, ideal stoichiometric composition, unaffected by α-radiation damage, and is chemically pure. A zircon sample from Jemaa, Nigeria has the largest unit-cell parameters because of the effect of α-radiation doses received over a long time (2384 Ma). All the samples show good correlations between Zr and Si apfu (atom per formula unit) versus unit-cell volume, V. The α-radiation doses in the samples are lower than ~3.5 × 1015 α-decay events/mg. Substitutions of other cations at the Zr and Si sites control the variations of the structural parameters. Relatively large unit-cell parameters and bond distances occur because the Zr site accommodates other cations that have larger ionic radii than the Zr atom. Geological age increases the radiation doses in zircon and it is related to V.

Study of the optical phenomena in zircon with a Scanning Electron Microscope (SEM), using cathodoluminescence method and secondary electrons.

The objective of this study is to analyze, describe and characterize, images in SEM (Scanning Electron Microscopy) and how a zircon sample ZR 008 (CRL05) behaves, in order to determine the possible locations where the laser ablation will be made (Ar/F). This procedure will be done to assist in the geological dating process, using the method by ICP / MS. Cathodluminescence and secondary electrons method were used in the process.