pulsed measurements
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Pulsed Measurements Based Investigation of Trap Capture and Emission Processes in CNTFETs

2021 ◽  
pp. 1-1
Author(s):  
Christoph Weimer ◽  
Anibal Pacheco-Sanchez ◽  
Jens Trommer ◽  
Michael Schroter
Keyword(s):  
Pulsed Measurements

scholarly journals Corrections to “Pulsed Measurements Based Investigation of Trap Capture and Emission Processes in CNTFETs”

2021 ◽  
Vol 20 ◽  
pp. 561-561
Author(s):  
Christoph Weimer ◽  
Anibal Pacheco-Sanchez ◽  
Jens Trommer ◽  
Michael Schroter
Keyword(s):  
Pulsed Measurements

scholarly journals PROCESSING OF THE DIGITAL IMAGES OF ANALOGOUS OSCILLOGRAMS AT PULSED MEASUREMENTS

2020 ◽  
Vol 1 (126) ◽  
pp. 54-66
Author(s):  
Alexander Ivon ◽  
Valery Istushkin ◽  
Yuri Rybka ◽  
Sergey Savran
Keyword(s):  
Relative Error ◽  
Digital Images ◽  
Semiconductor Materials ◽  
The Internet ◽  
Electric Currents ◽  
Software Environment ◽  
Internet Browser ◽  
Current Voltage ◽  
Current Voltage Characteristics ◽  
Pulsed Measurements

A program for processing the digital images of analog oscillograms at pulsed measurements of the current-voltage characteristics of semiconductor materials and devices in the region of high electric currents is presented. The processing of digital images in this program bases on scanning of coordinates and allows measuring the instantaneous voltages and currents with a relative error of no more than 1%. The program is created using the languages HTML5, CSS3, JavaScript and Canvas technology. The software environment for program run is the Internet browser.

Pulsed Measurements

2018 ◽  
pp. 18-1-18-29
Author(s):  
Anthony E. Parker ◽  
James G. Rathmell ◽  
Jonathan B. Scott
Keyword(s):  
Pulsed Measurements
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