pbte film
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Percolation model of electric properties of laser modified PbTe film

Journal of Physics Conference Series ◽

10.1088/1742-6596/1822/1/012014 ◽

2021 ◽

Vol 1822 (1) ◽

pp. 012014

Author(s):

D.N. Bukharov ◽

I.O. Scryabin ◽

A.F. Lelekova ◽

M.R. Sisoyev ◽

S.M. Arakelian

Keyword(s):

Percolation Model ◽

Electric Properties ◽

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Temperature coefficient of the refractive index for PbTe film

Chinese Optics Letters ◽

10.3788/col201715.043101 ◽

2017 ◽

Vol 15 (4) ◽

pp. 043101-43103

Author(s):

Lingmao Xu Lingmao Xu ◽

Hui Zhou Hui Zhou ◽

Yanchun He Yanchun He ◽

Kaifeng Zhang Kaifeng Zhang ◽

Shenghu Wu Shenghu Wu ◽

...

Keyword(s):

Refractive Index ◽

Temperature Coefficient ◽

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The 60° or 180° twinned Bi-doped PbTe film studied by EBSD

Applied Surface Science ◽

10.1016/j.apsusc.2010.06.084 ◽

2010 ◽

Vol 257 (1) ◽

pp. 271-275

Author(s):

S.Y. Ren ◽

Y.K. Yang ◽

H.D. Li ◽

D.M. Li ◽

X.Y. Lv ◽

...

Keyword(s):

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One-dimensional Photonic Crystal and Photoconductive PbTe Film for Low Cost Resonant-cavity-enhanced Mid-infrared Photodetector

10.1364/ipnra.2008.iwe6 ◽

2008 ◽

Author(s):

Jianfei Wang ◽

Juejun Hu ◽

Xiaochen Sun ◽

Anuradha M. Agarwal ◽

Lionel C. Kimerling ◽

...

Keyword(s):

Photonic Crystal ◽

Low Cost ◽

Resonant Cavity ◽

Infrared Photodetector ◽

Mid Infrared ◽

One Dimensional ◽

Dimensional Photonic Crystal ◽

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A twinned PbTe film induced by the 7×7 reconstruction of Si(111)

Journal of Crystal Growth ◽

10.1016/j.jcrysgro.2004.09.034 ◽

2004 ◽

Vol 273 (1-2) ◽

pp. 156-160 ◽

Author(s):

H.Y. Chen ◽

S.S. Dong ◽

Y.K. Yang ◽

D.M. Li ◽

J.H. Zhang ◽

...

Keyword(s):

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Growth of PbTe films by magnetron sputtering

MRS Proceedings ◽

10.1557/proc-691-g8.32 ◽

2001 ◽

Vol 691 ◽

Author(s):

A. Jdanov ◽

J. Pelleg ◽

Z. Dashevsky ◽

R. Shneck

Keyword(s):

Electron Microscopy ◽

Magnetron Sputtering ◽

Deposition Time ◽

Rf Magnetron Sputtering ◽

High Resolution Electron Microscopy ◽

Substrate Heating ◽

Glass Substrates ◽

Auger Depth Profile ◽

Resolution Electron ◽

ABSTRACTThin films of PbTe were deposited on Si (111) wafers and glass substrates at a constant power for different times and at a constant time at various power levels. In some cases substrate heating to a temperature of ∼673K was performed during sputtering. Structural analysis by Xray diffraction (XRD) and high-resolution electron microscopy (HRTEM) were performed. The composition of the PbTe film was evaluated by Auger depth profile. At an appropriate combination of power and deposition time only (200) and its higher order peaks were observed in the PbTe film. It is expected that it is feasible to obtain epitaxial PbTe film by RF magnetron sputtering.

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Microstructure of the source material for PbTe film deposition

10.1117/12.190732 ◽

1994 ◽

Author(s):

Su-ying Zhang ◽

Ge-ya Wang ◽

Tian-Shen Shi

Keyword(s):

Source Material ◽

Film Deposition ◽

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Oxygen and monatomic hydrogen interactions with PbTe film surfaces prepared by molecular-beam deposition

Applied Physics A Solids and Surface ◽

10.1007/bf00616585 ◽

1986 ◽

Vol 40 (1) ◽

pp. 7-12 ◽

Author(s):

R. A. A. Kubiak ◽

S. R. L. McGlashan ◽

R. M. King ◽

E. H. C. Parker

Keyword(s):

Molecular Beam ◽

Molecular Beam Deposition ◽

Pbte Film ◽

Beam Deposition

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