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Electronics Reliability and Measurement Technology
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TOTAL DOCUMENTS
20
(FIVE YEARS 0)
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1
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Published By Elsevier
9780815511717
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Electronics Reliability and Measurement Technology
◽
10.1016/b978-0-8155-1171-7.50018-4
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1988
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pp. iii
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HANDBOOK OF CONTAMINATION CONTROL IN MICROELECTRONICS: Principles, Applications and Technology
Electronics Reliability and Measurement Technology
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10.1016/b978-081551171-7.50016-0
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1988
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pp. ibc1
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Cited By ~ 1
Author(s):
Donald L. Tolliver
Keyword(s):
Contamination Control
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“WHOLE WAFER” SCANNING ELECTRON MICROSCOPY
Electronics Reliability and Measurement Technology
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10.1016/b978-081551171-7.50015-9
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1988
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pp. 123-128
Author(s):
J. Devaney
Keyword(s):
Electron Microscopy
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Scanning Electron Microscopy
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Scanning Electron
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HETERODYNE HOLOGRAPHIC INTERFEROMETRY: HIGH-RESOLUTION RANGING AND DISPLACEMENT MEASUREMENT
Electronics Reliability and Measurement Technology
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10.1016/b978-081551171-7.50014-7
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1988
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pp. 107-122
Author(s):
James W. Wagner
Keyword(s):
High Resolution
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Holographic Interferometry
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Displacement Measurement
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INTELLIGENT LASER SOLDERING INSPECTION AND PROCESS CONTROL
Electronics Reliability and Measurement Technology
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10.1016/b978-081551171-7.50012-3
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1988
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pp. 79-88
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Cited By ~ 1
Author(s):
Riccardo Vanzetti
Keyword(s):
Process Control
◽
Laser Soldering
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SURFACE INSPECTION–RESEARCH AND DEVELOPMENT
Electronics Reliability and Measurement Technology
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10.1016/b978-081551171-7.50006-8
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1988
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pp. 34-36
Author(s):
J.S. Batchelder
Keyword(s):
Research And Development
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Surface Inspection
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EXECUTIVE SUMMARY OF FINDINGS AND RECOMMENDATIONS
Electronics Reliability and Measurement Technology
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10.1016/b978-081551171-7.50003-2
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1988
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pp. 1-6
Keyword(s):
Executive Summary
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RADIATION EFFECTS ON AND DOSE ENHANCEMENT OF ELECTRONIC MATERIALS
Electronics Reliability and Measurement Technology
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10.1016/b978-0-8155-1171-7.50020-2
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1988
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pp. ibc3
Author(s):
J.R. Srour
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D.M. Long
Keyword(s):
Radiation Effects
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Electronic Materials
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Dose Enhancement
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RUPTURE TESTING FOR THE QUALITY CONTROL OF ELECTRODEPOSITED COPPER INTERCONNECTIONS IN HIGH-SPEED, HIGH-DENSITY CIRCUITS
Electronics Reliability and Measurement Technology
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10.1016/b978-081551171-7.50013-5
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1988
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pp. 89-106
Author(s):
Louis Zakraysek
Keyword(s):
Quality Control
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High Speed
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High Density
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MEASUREMENT SCIENCE AND MANUFACTURING SCIENCE RESEARCH
Electronics Reliability and Measurement Technology
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10.1016/b978-081551171-7.50004-4
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1988
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pp. 7-16
Author(s):
D. Howard Phillips
Keyword(s):
Science Research
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Measurement Science
◽
Manufacturing Science
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