Nano Science and Technolgy - Applied Scanning Probe Methods VIII
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Published By Springer Berlin Heidelberg

9783540740797, 9783540740803
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Cantilever Spring-Constant Calibration in Atomic Force Microscopy

2007 ◽  
pp. 289-314 ◽  
Author(s):  
Peter J. Cumpson ◽  
Charles A. Clifford ◽  
Jose F. Portoles ◽  
James E. Johnstone ◽  
Martin Munz
Keyword(s):  
Atomic Force Microscopy ◽  
Spring Constant ◽  
Force Microscopy ◽  
Atomic Force

Near Field Probes: From Optical Fibers to Optical Nanoantennas

2007 ◽  
pp. 77-135 ◽  
Author(s):  
Eugenio Cefalì ◽  
Salvatore Patanè ◽  
Salvatore Spadaro ◽  
Renato Gardelli ◽  
Matteo Albani ◽  
...  
Keyword(s):  
Optical Fibers ◽  
Near Field ◽  
Optical Nanoantennas

Background-Free Apertureless Near-Field Optical Imaging

2007 ◽  
pp. 1-29 ◽  
Author(s):  
Pietro Giuseppe Gucciardi ◽  
Guillaume Bachelier ◽  
Stephan J. Stranick ◽  
Maria Allegrini
Keyword(s):  
Optical Imaging ◽  
Near Field

Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging

2007 ◽  
pp. 137-181 ◽  
Author(s):  
Sophie Marsaudon ◽  
Charlotte Bernard ◽  
Dirk Dietzel ◽  
Cattien V. Nguyen ◽  
Anne Marie Bonnot ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Carbon Nanotubes
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