2014 9th International Design and Test Symposium (IDT)
Latest Publications

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Published By IEEE

9781479982004

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Nonvolatile memories: Present and future challenges

2014 9th International Design and Test Symposium (IDT) ◽

10.1109/idt.2014.7038588 ◽

2014 ◽

Cited By ~ 18

Author(s):

Elena Ioana Vatajelu ◽

Hassen Aziza ◽

Cristian Zambelli

Keyword(s):

Nonvolatile Memories ◽

Future Challenges

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Technical program committee

2014 9th International Design and Test Symposium (IDT) ◽

10.1109/idt.2014.7038567 ◽

2014 ◽

Keyword(s):

Program Committee ◽

Technical Program Committee ◽

Technical Program

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Translating of MATLAB/SIMULINLK model to synchronous dataflow graph for parallelism analysis and programming embedded multicore systems

2014 9th International Design and Test Symposium (IDT) ◽

10.1109/idt.2014.7038605 ◽

2014 ◽

Cited By ~ 2

Author(s):

Kaouther Guesmi ◽

Salem Hasnaoui

Keyword(s):

Multicore Systems ◽

Dataflow Graph ◽

Synchronous Dataflow

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[Copyright notice]

2014 9th International Design and Test Symposium (IDT) ◽

10.1109/idt.2014.7038565 ◽

2014 ◽

Keyword(s):

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A new efficient reduction scheme to implement tree multipliers on FPGAs

2014 9th International Design and Test Symposium (IDT) ◽

10.1109/idt.2014.7038609 ◽

2014 ◽

Cited By ~ 1

Author(s):

Khaldoon M. Mhaidat ◽

Abdulmughni Y. Hamzah

Keyword(s):

Reduction Scheme ◽

Efficient Reduction

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Day 2: Invited talk spintronic microsystems: Integrating analog devices with CMOS

2014 9th International Design and Test Symposium (IDT) ◽

10.1109/idt.2014.7038573 ◽

2014 ◽

Author(s):

Paulo Freitas

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Modeling of silicon MEMS capacitive pressure sensor for biomédical applications

2014 9th International Design and Test Symposium (IDT) ◽

10.1109/idt.2014.7038625 ◽

2014 ◽

Cited By ~ 1

Author(s):

Lakhdari Abdelghani ◽

MekkakiaMaaza Nasr-Eddine ◽

Maamar Azouza ◽

Bouguenna Abdellah ◽

Kichene Moadh

Keyword(s):

Pressure Sensor ◽

Capacitive Pressure Sensor

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Computational complexity in test-generation algorithms

2014 9th International Design and Test Symposium (IDT) ◽

10.1109/idt.2014.7038599 ◽

2014 ◽

Author(s):

Jozsef Sziray

Keyword(s):

Computational Complexity ◽

Test Generation

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Failure and root cause analysis for a system-on-chip: An industrial case study

2014 9th International Design and Test Symposium (IDT) ◽

10.1109/idt.2014.7038578 ◽

2014 ◽

Author(s):

Samir Boubezari ◽

Jayant Chhabria

Keyword(s):

Root Cause Analysis ◽

System On Chip ◽

Industrial Case Study ◽

Cause Analysis ◽

Root Cause ◽

On Chip

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Analytical approach of the impact of through silicon via on the performance of MOS devices

2014 9th International Design and Test Symposium (IDT) ◽

10.1109/idt.2014.7038621 ◽

2014 ◽

Cited By ~ 1

Author(s):

Mohamed El Amine Benkechkache ◽

Saida Latreche ◽

Gian-Franco Dalla Betta

Keyword(s):

Analytical Approach ◽

Through Silicon Via ◽

Mos Devices ◽

The Impact

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2014 9th International Design and Test Symposium (IDT)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Nonvolatile memories: Present and future challenges

Technical program committee

Translating of MATLAB/SIMULINLK model to synchronous dataflow graph for parallelism analysis and programming embedded multicore systems

[Copyright notice]

A new efficient reduction scheme to implement tree multipliers on FPGAs

Day 2: Invited talk spintronic microsystems: Integrating analog devices with CMOS

Modeling of silicon MEMS capacitive pressure sensor for biomédical applications

Computational complexity in test-generation algorithms

Failure and root cause analysis for a system-on-chip: An industrial case study

Analytical approach of the impact of through silicon via on the performance of MOS devices

2014 9th International Design and Test Symposium (IDT)
Latest Publications