IEEE 2011 International SOI Conference
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9781612847603, 9781612847610, 9781612847597
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Strain reduction in Silicon-on-Sapphire by wafer bonding

2011 ◽  
Author(s):  
G.P. Imthurn ◽  
A.M. Miscione ◽  
K. Landry ◽  
A. Vaufredaz ◽  
T. Barge ◽  
...  
Keyword(s):  
Wafer Bonding

Variability origins of FinFETs and perspective beyond 20nm node

2011 ◽  
Author(s):  
Takashi Matsukawa ◽  
Yongxun Liu ◽  
Kazuhiko Endo ◽  
Shin-ichi O'uchi ◽  
Meishoku Masahara

High density DRAM for space utilizing embedded DRAMs macros in 32nm SOI CMOS

2011 ◽  
Author(s):  
Jeremy Popp ◽  
John Ballast ◽  
Salim Rabaa ◽  
Tony McKay ◽  
Jim Braatz
Keyword(s):  
High Density ◽  
Soi Cmos

Impacts of single trap induced random telegraph noise on finfet devices and SRAM cell stability

2011 ◽  
Author(s):  
Ming-Long Fan ◽  
Vita Pi-Ho Hu ◽  
Yin-Nien Chen ◽  
Pin Su ◽  
Ching-Te Chuang
Keyword(s):  
Random Telegraph Noise ◽  
Sram Cell ◽  
Telegraph Noise ◽  
Cell Stability

Properties of 22nm node extremely-thin-SOI MOSFETs

2011 ◽  
Author(s):  
N. Rodriguez ◽  
F. Andrieu ◽  
C. Navarro ◽  
O. Faynot ◽  
F. Gamiz ◽  
...  

Mobility profiles and thermal characterization of SOI and Si-on-SiC hybrid substrates

2011 ◽  
Author(s):  
S. Lotfi ◽  
L.-G. Li ◽  
O. Vallin ◽  
H. Norstrom ◽  
J. Olsson
Keyword(s):  
Thermal Characterization ◽  
Hybrid Substrates
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