A critical re-examination of body-bias on the soft error rate and single-event latch-up in automotive SRAMs

2017 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2017.7936268 ◽

2017 ◽

Author(s):

N. N. Mahatme ◽

B. Min ◽

K. Loiko

Keyword(s):

Single Event ◽

Soft Error Rate ◽

Body Bias ◽

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Accelerating soft-error-rate (SER) estimation in the presence of single event transients

Proceedings of the 53rd Annual Design Automation Conference on - DAC '16 ◽

10.1145/2897937.2897976 ◽

2016 ◽

Author(s):

Ji Li ◽

Jeffrey Draper

Keyword(s):

Single Event ◽

Soft Error Rate ◽

Single Event Transients

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Flip-flops soft error rate evaluation approach considering internal single-event transient

Science China Information Sciences ◽

10.1007/s11432-014-5260-z ◽

2015 ◽

Vol 58 (6) ◽

pp. 1-12 ◽

Author(s):

RuiQiang Song ◽

ShuMing Chen ◽

YiBai He ◽

YanKang Du

Keyword(s):

Single Event ◽

Single Event Transient ◽

Soft Error Rate ◽

Evaluation Approach ◽

Rate Evaluation

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A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology

IEEE Transactions on Reliability ◽

10.1109/tr.2015.2427372 ◽

2016 ◽

Vol 65 (1) ◽

pp. 248-255 ◽

Author(s):

Yankang Du ◽

Shuming Chen

Keyword(s):

Metal Oxide ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Combinational Circuits ◽

Single Event ◽

Single Event Transient ◽

Soft Error Rate ◽

Bulk Technology

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Circuit-Level Soft Error Rate Evaluation Approach Considering Single-Event Multiple Transient

2019 IEEE 13th International Conference on ASIC (ASICON) ◽

10.1109/asicon47005.2019.8983536 ◽

2019 ◽

Author(s):

Xiaoyu Zhang ◽

Bin Liang ◽

Ruiqiang Song

Keyword(s):

Single Event ◽

Soft Error Rate ◽

Evaluation Approach ◽

Rate Evaluation

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Synthetic soft error rate simulation considering neutron-induced single event transient from transistor to LSI-chip level

2008 International Conference on Simulation of Semiconductor Processes and Devices ◽

10.1109/sispad.2008.4648313 ◽

2008 ◽

Author(s):

Masami Hane ◽

Hideyuki Nakamura ◽

Katsuhiko Tanaka ◽

Kentaro Watanabe ◽

Yoshiharu Tosaka ◽

...

Keyword(s):

Single Event ◽

Single Event Transient ◽

Soft Error Rate

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Physics of Multiple-Node Charge Collection and Impacts on Single-Event Characterization and Soft Error Rate Prediction

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2013.2260357 ◽

2013 ◽

Vol 60 (3) ◽

pp. 1836-1851 ◽

Author(s):

J. D. Black ◽

P. E. Dodd ◽

K. M. Warren

Keyword(s):

Charge Collection ◽

Single Event ◽

Soft Error Rate ◽

Multiple Node ◽

Rate Prediction

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Impact of Body Bias Based Leakage Power Reduction on Soft Error Rate

2012 25th International Conference on VLSI Design ◽

10.1109/vlsid.2012.49 ◽

2012 ◽

Author(s):

Warin Sootkaneung ◽

Kewal K. Saluja

Keyword(s):

Power Reduction ◽

Leakage Power ◽

Soft Error Rate ◽

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High-accuracy estimation of soft error rate using PHYSERD with circuit simulation

2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ◽

10.1109/sispad.2014.6931634 ◽

2014 ◽

Author(s):

Takashi Kato ◽

Taiki Uemura ◽

Hideya Matsuyama

Keyword(s):

Circuit Simulation ◽

High Accuracy ◽

Accuracy Estimation ◽

Soft Error Rate

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CLEAR: A Cross-Layer Soft Error Rate Reduction method based on mitigating DETs in nanoscale combinational logics

Microprocessors and Microsystems ◽

10.1016/j.micpro.2021.104282 ◽

2021 ◽

pp. 104282

Author(s):

Amir M. Hajisadeghi ◽

Hamid R. Zarandi

Keyword(s):

Reduction Method ◽

Cross Layer ◽

Rate Reduction ◽

Soft Error Rate

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Underground characterization and modeling of alpha-particle induced Soft-Error Rate in CMOS 65nm SRAM

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131359 ◽

2011 ◽

Author(s):

S. Martinie ◽

J.L. Autran ◽

S. Sauze ◽

D. Munteanu ◽

S. Uznanski ◽

...

Keyword(s):

Alpha Particle ◽

Soft Error Rate

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