Synthesis, Crystal Growth and Characterization
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STRUCTURE OF TIN OXIDE FILMS

Synthesis, Crystal Growth and Characterization ◽

10.1016/b978-0-444-86435-2.50023-6 ◽

1982 ◽

pp. 389-397

Author(s):

S.K. PENEVA ◽

D.D. NIHTIANOVA ◽

R.K. RUDARSKA ◽

K.D. DJUNEVA ◽

I.Z. KOSTADINOV

Keyword(s):

Tin Oxide ◽

Oxide Films ◽

Tin Oxide Films

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THE STRUCTURE OF GRAIN BOUNDARIES

Synthesis, Crystal Growth and Characterization ◽

10.1016/b978-0-444-86435-2.50022-4 ◽

1982 ◽

pp. 373-388

Author(s):

S. RANGANATHAN

Keyword(s):

Grain Boundaries

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CHARACTERISATION OF CRYSTAL PERFECTION BY DIFFRACTION METHODS

Synthesis, Crystal Growth and Characterization ◽

10.1016/b978-0-444-86435-2.50015-7 ◽

1982 ◽

pp. 213-214

Author(s):

NORIO KATO

Keyword(s):

Crystal Perfection

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FUNDAMENTAL ASPECTS AND TECHNIQUES OF CRYSTAL GROWTH FROM THE MELT

Synthesis, Crystal Growth and Characterization ◽

10.1016/b978-0-444-86435-2.50012-1 ◽

1982 ◽

pp. 135-183

Author(s):

CARLO PAORICI

Keyword(s):

Crystal Growth

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FUNDAMENTAL ASPECTS OF CRYSTAL GROWTH AND EPITAXY (in-situ STUDIES)

Synthesis, Crystal Growth and Characterization ◽

10.1016/b978-0-444-86435-2.50011-x ◽

1982 ◽

pp. 119-134 ◽

Cited By ~ 1

Author(s):

R. KERN

Keyword(s):

Crystal Growth ◽

In Situ Studies

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SPONSORING ORGANISATIONS

Synthesis, Crystal Growth and Characterization ◽

10.1016/b978-0-444-86435-2.50004-2 ◽

1982 ◽

pp. v-vi

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MODERN PHYSICS AND SYĀDVĀDA

Synthesis, Crystal Growth and Characterization ◽

10.1016/b978-0-444-86435-2.50032-7 ◽

1982 ◽

pp. 555-568

Author(s):

D.S. KOTHARI

Keyword(s):

Modern Physics

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CHARACTERISATION OF MATERIALS BY NEUTRON SCATTERING

Synthesis, Crystal Growth and Characterization ◽

10.1016/b978-0-444-86435-2.50024-8 ◽

1982 ◽

pp. 399-412

Author(s):

R. CHIDAMBARAM ◽

A. SEQUEIRA

Keyword(s):

Neutron Scattering

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DEFECT CHARACTERIZATION USING TRANSMISSION AND SCANNING ELECTRON MICROSCOPY

Synthesis, Crystal Growth and Characterization ◽

10.1016/b978-0-444-86435-2.50021-2 ◽

1982 ◽

pp. 339-371 ◽

Cited By ~ 1

Author(s):

J. HEYDENREICH

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Defect Characterization ◽

Scanning Electron

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CHARACTERIZATION OF POINT DEFECT AGGREGATES IN NEARLY PERFECT CRYSTALS BY DIFFUSE X-RAY SCATTERING MEASUREMENTS

Synthesis, Crystal Growth and Characterization ◽

10.1016/b978-0-444-86435-2.50019-4 ◽

1982 ◽

pp. 287-315

Author(s):

KRISHAN LAL

Keyword(s):

Point Defect ◽

X Ray ◽

X Ray Scattering ◽

Scattering Measurements ◽

Ray Scattering

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