2006 IEEE International Integrated Reliability Workshop Final Report
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72
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Published By IEEE

1424402964, 1424402972
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

NiSi Polysilicon Fuse Reliability in 65nm Logic CMOS Technology

2006 ◽  
Author(s):  
Boon Ang ◽  
Sergey Tumakha ◽  
Jay Im ◽  
Sunhom Paak
Keyword(s):  
Cmos Technology

Impact of TiN Plasma Post-treatment on Alumina Electron Trapping

2006 ◽  
Author(s):  
A. Bajolet ◽  
S. Bruyere ◽  
M. Proust ◽  
L. Montes ◽  
G. Ghibaudo
Keyword(s):  
Post Treatment ◽  
Electron Trapping ◽  
Tin Plasma

Lithography CD Variation effects on LFNDMOS Transistor Hot-Carrier Degradation

2006 ◽  
Author(s):  
M. Thomason ◽  
C. Billman ◽  
B. Greenwood ◽  
B. Williams ◽  
C. Belisle ◽  
...  
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Degradation

Ultra-Fast Measurements of VTH Instability in SiC MOSFETs due to Positive and Negative Constant Bias Stress

2006 ◽  
Author(s):  
M. Gurfinkel ◽  
J. Suehle ◽  
J.B. Bernstein ◽  
Y. Shapira ◽  
A.J. Lelis ◽  
...  
Keyword(s):  
Bias Stress ◽  
Constant Bias ◽  
Negative Constant

On the impact of the NBTI recovery phenomenon on lifetime prediction of modern p-MOSFETs

2006 ◽  
Author(s):  
Christian Schlunder ◽  
Wolfgang Heinrigs ◽  
Wolfgang Gustin ◽  
Hans Reisinger
Keyword(s):  
Lifetime Prediction ◽  
The Impact
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