2006 IEEE International Integrated Reliability Workshop Final Report
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

1424402964, 1424402972

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Spatial Probing of Traps in nMOSFET with ALD HfO2/SiO2 Stacks Using Low Frequency Noise Characteristics

2006 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/irws.2006.305222 ◽

2006 ◽

Cited By ~ 1

Author(s):

H.d. Xiong ◽

J.S. Suehle

Keyword(s):

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Noise Characteristics

Download Full-text

Effects of Delay Time and AC Factors on Negative Bias Temperature Instability of PMOSFETs

2006 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/irws.2006.305202 ◽

2006 ◽

Cited By ~ 2

Author(s):

Jih-san Li ◽

Main-gwo Chen ◽

Pi-chun Juan ◽

Kuan-cheng Su

Keyword(s):

Delay Time ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability

Download Full-text

Wafer Reliability Evaluation and Monitoring for InGaAsP Devices

2006 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/irws.2006.305246 ◽

2006 ◽

Cited By ~ 8

Author(s):

David Verbitsky

Keyword(s):

Reliability Evaluation ◽

Evaluation And Monitoring

Download Full-text

NiSi Polysilicon Fuse Reliability in 65nm Logic CMOS Technology

2006 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/irws.2006.305218 ◽

2006 ◽

Author(s):

Boon Ang ◽

Sergey Tumakha ◽

Jay Im ◽

Sunhom Paak

Keyword(s):

Cmos Technology

Download Full-text

Reliability of On-The-Shelf Stored Image Sensors

2006 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/irws.2006.305250 ◽

2006 ◽

Author(s):

Albert Theuwissen

Keyword(s):

Image Sensors

Download Full-text

Impact of TiN Plasma Post-treatment on Alumina Electron Trapping

2006 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/irws.2006.305206 ◽

2006 ◽

Author(s):

A. Bajolet ◽

S. Bruyere ◽

M. Proust ◽

L. Montes ◽

G. Ghibaudo

Keyword(s):

Post Treatment ◽

Electron Trapping ◽

Tin Plasma

Download Full-text

Lithography CD Variation effects on LFNDMOS Transistor Hot-Carrier Degradation

2006 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/irws.2006.305233 ◽

2006 ◽

Author(s):

M. Thomason ◽

C. Billman ◽

B. Greenwood ◽

B. Williams ◽

C. Belisle ◽

...

Keyword(s):

Hot Carrier ◽

Hot Carrier Degradation

Download Full-text

Ultra-Fast Measurements of VTH Instability in SiC MOSFETs due to Positive and Negative Constant Bias Stress

2006 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/irws.2006.305209 ◽

2006 ◽

Cited By ~ 2

Author(s):

M. Gurfinkel ◽

J. Suehle ◽

J.B. Bernstein ◽

Y. Shapira ◽

A.J. Lelis ◽

...

Keyword(s):

Bias Stress ◽

Constant Bias ◽

Negative Constant

Download Full-text

On the impact of the NBTI recovery phenomenon on lifetime prediction of modern p-MOSFETs

2006 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/irws.2006.305199 ◽

2006 ◽

Cited By ~ 22

Author(s):

Christian Schlunder ◽

Wolfgang Heinrigs ◽

Wolfgang Gustin ◽

Hans Reisinger

Keyword(s):

Lifetime Prediction ◽

The Impact

Download Full-text

Cryogenic Performance and Reliability of GaAs CHFETs

2006 IEEE International Integrated Reliability Workshop Final Report ◽

10.1109/irws.2006.305232 ◽

2006 ◽

Author(s):

R. Leon ◽

Y. Chen

Download Full-text

2006 IEEE International Integrated Reliability Workshop Final ReportLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Spatial Probing of Traps in nMOSFET with ALD HfO2/SiO2 Stacks Using Low Frequency Noise Characteristics

Effects of Delay Time and AC Factors on Negative Bias Temperature Instability of PMOSFETs

Wafer Reliability Evaluation and Monitoring for InGaAsP Devices

NiSi Polysilicon Fuse Reliability in 65nm Logic CMOS Technology

Reliability of On-The-Shelf Stored Image Sensors

Impact of TiN Plasma Post-treatment on Alumina Electron Trapping

Lithography CD Variation effects on LFNDMOS Transistor Hot-Carrier Degradation

Ultra-Fast Measurements of VTH Instability in SiC MOSFETs due to Positive and Negative Constant Bias Stress

On the impact of the NBTI recovery phenomenon on lifetime prediction of modern p-MOSFETs

Cryogenic Performance and Reliability of GaAs CHFETs

2006 IEEE International Integrated Reliability Workshop Final Report
Latest Publications