Spatial Probing of Traps in nMOSFET with ALD HfO2/SiO2 Stacks Using Low Frequency Noise Characteristics

Author(s):  
H.d. Xiong ◽  
J.S. Suehle
2021 ◽  
Vol 42 (3) ◽  
pp. 442-445
Author(s):  
Dongseok Kwon ◽  
Wonjun Shin ◽  
Jong-Ho Bae ◽  
Suhwan Lim ◽  
Byung-Gook Park ◽  
...  

2007 ◽  
Vol 28 (1) ◽  
pp. 36-38 ◽  
Author(s):  
Yen Ping Wang ◽  
San Lein Wu ◽  
Shoou Jinn Chang

2015 ◽  
Vol 55 (1) ◽  
pp. 52-61 ◽  
Author(s):  
Sandra Pralgauskaitė ◽  
Vilius Palenskis ◽  
Jonas Matukas ◽  
Justinas Glemža ◽  
Grigorij Muliuk ◽  
...  

1999 ◽  
Vol 20 (1) ◽  
pp. 54-56 ◽  
Author(s):  
Ying-Che Tseng ◽  
W.M. Huang ◽  
E. Spears ◽  
D. Spooner ◽  
D. Ngo ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document