Characterization of Advanced Materials
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Published By Springer US

9781461366393, 9781461536888
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

TEM Studies of Semiconductor Materials

1991 ◽  
pp. 89-96
Author(s):  
John C. Bravman
Keyword(s):  
Semiconductor Materials

The Characterization of New Austenitic Stainless Steels Highly Resistant to Cavitation-Erosion

1991 ◽  
pp. 97-122 ◽  
Author(s):  
G. L'Esperance ◽  
M. Simoneau ◽  
P. Lambert ◽  
J. I. Dickson ◽  
R. Simoneau
Keyword(s):  
Stainless Steels ◽  
Cavitation Erosion ◽  
Austenitic Stainless Steels

Stereo X-Ray Radiography of Composite Materials

1991 ◽  
pp. 1-7
Author(s):  
Russell D. Jamison
Keyword(s):  
Composite Materials ◽  
X Ray

Characterization of Microstructures in Rapidly Solidified Alloys

1991 ◽  
pp. 149-166 ◽  
Author(s):  
N. J. Kim ◽  
S. J. Das
Keyword(s):  
Rapidly Solidified

Adiabatic Thermography of Composite Materials

1991 ◽  
pp. 65-76 ◽  
Author(s):  
K. L. Reifsnider ◽  
C. E. Bakis
Keyword(s):  
Composite Materials

High Speed Heterodyne Holographic Interferometry

1991 ◽  
pp. 27-40
Author(s):  
James W. Wagner
Keyword(s):  
Holographic Interferometry ◽  
High Speed

Optical Fiber Waveguide Methods for Advanced Materials

1991 ◽  
pp. 41-63 ◽  
Author(s):  
P. A. Ehrenfeuchter ◽  
R. O. Claus
Keyword(s):  
Optical Fiber ◽  
Advanced Materials ◽  
Fiber Waveguide

Application of X-Ray Computed Tomography to Ceramic/Ceramic Composites

1991 ◽  
pp. 9-25
Author(s):  
W. A. Ellingson ◽  
M. W. Vannier ◽  
D. P. Stinton
Keyword(s):  
Computed Tomography ◽  
Ceramic Composites ◽  
X Ray ◽  
X Ray Computed
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