2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)
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116
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3
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Published By IEEE

9781538637128
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Particle removal characteristics in liquid flow during wafer rotation

2018 ◽  
Author(s):  
Naoyuki Handa ◽  
Satomi Hamada ◽  
Masayoshi Imai ◽  
Yutaka Wada ◽  
Hiroshi Sobukawa ◽  
...  
Keyword(s):  
Liquid Flow ◽  
Particle Removal

Energy and Area Efficient Tunnel FET-based Spiking Neural Networks

2018 ◽  
Author(s):  
Dinesh Rajasekharan ◽  
Sarvesh S. Chauhan ◽  
Amit Ranjan Trivedi ◽  
Yogesh Singh Chauhan
Keyword(s):  
Neural Networks ◽  
Spiking Neural Networks ◽  
Tunnel Fet ◽  
Area Efficient

Quadrupole-electrode-integrated micropores for selective single-particle detections

2018 ◽  
Author(s):  
Tomoki Hayashida ◽  
Takahito Ohshiro ◽  
Makusu Tsutsui ◽  
Masateru Taniguchi
Keyword(s):  
Single Particle

Radio-frequency Superiority of Poly-Si TFTs with T-Shaped Gate and Air Spacers for IoT Applications

2018 ◽  
Author(s):  
Z. Y. Yang ◽  
Y.A. Huang ◽  
H. C. Lin ◽  
P. W. Li ◽  
K. M. Chen ◽  
...  
Keyword(s):  
Radio Frequency ◽  
Iot Applications

Atomic Layer Etching: Benefits and Challenges

2018 ◽  
Author(s):  
Thorsten Lill ◽  
Keren J. Kanarik ◽  
Samantha Tan ◽  
Skip Berry ◽  
Andreas Fischer ◽  
...  
Keyword(s):  
Atomic Layer ◽  
Atomic Layer Etching

Introduction of Seifu Nankai Jr. & Sr. High School

2018 ◽  
Author(s):  
Genki Horie ◽  
Yusuke Morita ◽  
Shota Yamashita ◽  
Hideki Yoshikado ◽  
Ryotaro Kobayashi ◽  
...  
Keyword(s):  
High School
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