Failure Analysis of Integrated Circuits
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15

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3

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Published By Springer US

9781461372318, 9781461549192

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Cross-Section Analysis

Failure Analysis of Integrated Circuits ◽

10.1007/978-1-4615-4919-2_9 ◽

1999 ◽

pp. 159-173 ◽

Cited By ~ 1

Author(s):

Tim Haddock ◽

Scott Boddicker

Keyword(s):

Cross Section ◽

Section Analysis

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Global Failure Site Isolation: Thermal Techniques

Failure Analysis of Integrated Circuits ◽

10.1007/978-1-4615-4919-2_5 ◽

1999 ◽

pp. 67-86 ◽

Cited By ~ 1

Author(s):

Daniel L. Barton

Keyword(s):

Site Isolation ◽

Thermal Techniques ◽

Failure Site

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Energy Dispersive Spectroscopy

Failure Analysis of Integrated Circuits ◽

10.1007/978-1-4615-4919-2_12 ◽

1999 ◽

pp. 205-215 ◽

Cited By ~ 3

Author(s):

Phuc D. Ngo

Keyword(s):

Energy Dispersive Spectroscopy ◽

Energy Dispersive

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IC Deprocessing

Failure Analysis of Integrated Circuits ◽

10.1007/978-1-4615-4919-2_8 ◽

1999 ◽

pp. 145-157 ◽

Cited By ~ 1

Author(s):

Daniel Yim

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Failure Site Isolation: Photon Emission Microscopy Optical/Electron Beam Techniques

Failure Analysis of Integrated Circuits ◽

10.1007/978-1-4615-4919-2_6 ◽

1999 ◽

pp. 87-112 ◽

Cited By ~ 3

Author(s):

Edward I. Cole ◽

Daniel L. Barton

Keyword(s):

Electron Beam ◽

Photon Emission ◽

Site Isolation ◽

Optical Electron ◽

Emission Microscopy ◽

Failure Site

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Secondary Ion Mass Spectrometry, SIMS

Failure Analysis of Integrated Circuits ◽

10.1007/978-1-4615-4919-2_14 ◽

1999 ◽

pp. 229-240

Author(s):

Keenan Evans

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Chemical Analysis

Failure Analysis of Integrated Circuits ◽

10.1007/978-1-4615-4919-2_11 ◽

1999 ◽

pp. 195-203 ◽

Cited By ~ 3

Author(s):

Lawrence C. Wagner

Keyword(s):

Chemical Analysis

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Inspection Techniques

Failure Analysis of Integrated Circuits ◽

10.1007/978-1-4615-4919-2_10 ◽

1999 ◽

pp. 175-193 ◽

Cited By ~ 2

Author(s):

Lawrence C. Wagner

Keyword(s):

Inspection Techniques

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Package Analysis: SAM and X-ray

Failure Analysis of Integrated Circuits ◽

10.1007/978-1-4615-4919-2_3 ◽

1999 ◽

pp. 43-57 ◽

Cited By ~ 3

Author(s):

Thomas M. Moore ◽

Cheryl D. Hartfield

Keyword(s):

X Ray

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FA Future Requirements

Failure Analysis of Integrated Circuits ◽

10.1007/978-1-4615-4919-2_15 ◽

1999 ◽

pp. 241-250 ◽

Cited By ~ 2

Author(s):

David P. Vallett

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