2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW)
Latest Publications

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Published By IEEE

9781509027514

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Improving indirect test efficiency using multi-directional tessellations in the measure space

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2016.7524230 ◽

2016 ◽

Cited By ~ 1

Author(s):

Alvaro Gomez-Pau ◽

Luz Balado ◽

Joan Figueras

Keyword(s):

Measure Space ◽

Indirect Test ◽

Test Efficiency

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Temperature sensors and measurements to test analogue circuits: questions and answers

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2016.7524241 ◽

2016 ◽

Cited By ~ 1

Author(s):

J. Altet ◽

A. Rubio ◽

F. Reverter ◽

X. Perpina ◽

X. Aragonés ◽

...

Keyword(s):

Temperature Sensors ◽

Questions And Answers ◽

Analogue Circuits

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Post-manufacturing "one-shot" calibration of analog/RF circuits based on non-intrusive sensors

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2016.7524240 ◽

2016 ◽

Cited By ~ 1

Author(s):

Martin Andraud ◽

Haralampos-G Stratigopoulos ◽

Emmanuel Simeu

Keyword(s):

Rf Circuits

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Using distortion shaping technique to equalize ADC THD performance between ATEs

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2016.7524223 ◽

2016 ◽

Cited By ~ 6

Author(s):

Peter Sarson ◽

Haruo Kobayashi

Keyword(s):

Shaping Technique

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Design trade-offs for on-chip driving of high-speed high-performance ADCs in static BIST applications

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2016.7524229 ◽

2016 ◽

Cited By ~ 4

Author(s):

A. J. Gines ◽

E. Peralias ◽

G. Leger ◽

A. Rueda ◽

G. Renaud ◽

...

Keyword(s):

High Speed ◽

High Performance ◽

Trade Offs ◽

On Chip

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Targeting hardware trojans in mixed-signal circuits for security

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2016.7524238 ◽

2016 ◽

Cited By ~ 3

Author(s):

Sabyasachi Deyati ◽

Barry J. Muldrey ◽

Abhijit Chatterjee

Keyword(s):

Hardware Trojans ◽

Mixed Signal ◽

Mixed Signal Circuits

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Defect diagnoses and localization methodology for pipelined ADCs

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2016.7524232 ◽

2016 ◽

Author(s):

Ashraf Ramadan ◽

Mohamed Abbas

Keyword(s):

Pipelined Adcs

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On-chip implementation of ECoG signal data decoding in brain-computer interface

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2016.7524225 ◽

2016 ◽

Cited By ~ 1

Author(s):

Mradul Agrawal ◽

Sandeep Vidyashankar ◽

Ke Huang

Keyword(s):

Brain Computer Interface ◽

Computer Interface ◽

On Chip

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Security aspects of analog and mixed-signal circuits

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2016.7524239 ◽

2016 ◽

Cited By ~ 6

Author(s):

Ilia Polian

Keyword(s):

Mixed Signal ◽

Mixed Signal Circuits

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Authentication and process control system based on optical variable nanostructures

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2016.7524235 ◽

2016 ◽

Cited By ~ 2

Author(s):

Jasbir N. Patel ◽

Hao Jiang ◽

Bozena Kaminska

Keyword(s):

Control System ◽

Process Control ◽

Process Control System

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2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Improving indirect test efficiency using multi-directional tessellations in the measure space

Temperature sensors and measurements to test analogue circuits: questions and answers

Post-manufacturing "one-shot" calibration of analog/RF circuits based on non-intrusive sensors

Using distortion shaping technique to equalize ADC THD performance between ATEs

Design trade-offs for on-chip driving of high-speed high-performance ADCs in static BIST applications

Targeting hardware trojans in mixed-signal circuits for security

Defect diagnoses and localization methodology for pipelined ADCs

On-chip implementation of ECoG signal data decoding in brain-computer interface

Security aspects of analog and mixed-signal circuits

Authentication and process control system based on optical variable nanostructures

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW)
Latest Publications