ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
Proceedings of International Symposium on Semiconductor Manufacturing
Latest Publications
TOTAL DOCUMENTS
69
(FIVE YEARS 0)
H-INDEX
5
(FIVE YEARS 0)
Published By IEEE
0780329287
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Through-UHV-Pump Impurity Back Diffusion Under Large Gas Flow and Its Minimization
Proceedings of International Symposium on Semiconductor Manufacturing
◽
10.1109/issm.1995.524412
◽
2005
◽
Author(s):
T. Shihata
◽
K. Ino
◽
N. Konishi
◽
T. Ohmi
◽
C. Urano
◽
...
Keyword(s):
Gas Flow
◽
Back Diffusion
Download Full-text
In-situ plasma cleaning by rotating transverse magnetic field
Proceedings of International Symposium on Semiconductor Manufacturing
◽
10.1109/issm.1995.524353
◽
2002
◽
Author(s):
T. Kawasima
◽
S. Bannai
◽
T. Chiba
◽
I. Honbori
◽
T. Kisakibaru
Keyword(s):
Magnetic Field
◽
Transverse Magnetic Field
◽
Transverse Magnetic
◽
Plasma Cleaning
Download Full-text
Applications of queuing theory and simulation to staffing in the semiconductor clean room environment
Proceedings of International Symposium on Semiconductor Manufacturing
◽
10.1109/issm.1995.524402
◽
2002
◽
Cited By ~ 3
Author(s):
A. Raviv
Keyword(s):
Queuing Theory
◽
Clean Room
◽
Clean Room Environment
Download Full-text
Simulating AMHS performance for semiconductor wafer fabrication
Proceedings of International Symposium on Semiconductor Manufacturing
◽
10.1109/issm.1995.524382
◽
2002
◽
Cited By ~ 2
Author(s):
N.G. Pierce
◽
R. Stafford
Keyword(s):
Wafer Fabrication
◽
Semiconductor Wafer
◽
Semiconductor Wafer Fabrication
Download Full-text
Solvent recycling for reuse in semiconductor manufacturing
Proceedings of International Symposium on Semiconductor Manufacturing
◽
10.1109/issm.1995.524392
◽
2002
◽
Cited By ~ 2
Author(s):
P.E. Dahlgren
Keyword(s):
Semiconductor Manufacturing
Download Full-text
Contamination issues in gas delivery to a gate oxide process
Proceedings of International Symposium on Semiconductor Manufacturing
◽
10.1109/issm.1995.524378
◽
2002
◽
Author(s):
S. Krishnan
◽
O. Laparra
◽
A. Tudhope
Keyword(s):
Gate Oxide
Download Full-text
Trace moisture measurement in HCl gas by near-infrared diode LASER spectroscopy
Proceedings of International Symposium on Semiconductor Manufacturing
◽
10.1109/issm.1995.524395
◽
2002
◽
Author(s):
Y. Ishihara
◽
H. Masusaki
◽
Shang-Qian Wu
◽
K. Matsumoto
◽
T. Kimijima
Keyword(s):
Diode Laser
◽
Laser Spectroscopy
◽
Near Infrared
◽
Moisture Measurement
◽
Diode Laser Spectroscopy
◽
Trace Moisture
◽
Hcl Gas
Download Full-text
Global planning at Harris Semiconductor
Proceedings of International Symposium on Semiconductor Manufacturing
◽
10.1109/issm.1995.524350
◽
2002
◽
Cited By ~ 3
Author(s):
S.V. Murty
◽
J.W. Bienvenu
Keyword(s):
Global Planning
Download Full-text
Manufacturability evaluation of deep submicron exposure tools using statistical metrology
Proceedings of International Symposium on Semiconductor Manufacturing
◽
10.1109/issm.1995.524396
◽
2002
◽
Author(s):
Crid Yu
◽
Hua-Yu Liu
◽
C.J. Spanos
Keyword(s):
Deep Submicron
◽
Manufacturability Evaluation
Download Full-text
Monitoring multi-stage sequential manufacturing processes: a Bayesian approach
Proceedings of International Symposium on Semiconductor Manufacturing
◽
10.1109/issm.1995.524386
◽
2002
◽
Cited By ~ 3
Author(s):
S. Rao
◽
A. Strojwas
◽
J. Lehoczky
◽
M. Schervish
Keyword(s):
Bayesian Approach
◽
Manufacturing Processes
◽
Multi Stage
Download Full-text
Load More ...
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close