2011 Semiconductor Conference Dresden
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85
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Published By IEEE

9781457704314
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Fast and efficient characterization of photolithographic systems by optical scatterometry

2011 ◽  
Author(s):  
F. Flach ◽  
S. Volkland ◽  
G. Holfeld ◽  
J. Schneider ◽  
T. Schade

Improved backwards analysis for architectural vulnerability factor estimation

2011 ◽  
Author(s):  
Robert Hartl ◽  
Andreas J. Rohatschek ◽  
Walter Stechele ◽  
Andreas Herkersdorf
Keyword(s):  
Vulnerability Factor ◽  
Factor Estimation

Charge transition levels of boron and silicon impurities in GaAs

2011 ◽  
Author(s):  
R. Leitsmann ◽  
F. Chicker ◽  
Ph. Planitz ◽  
C. Radehaus ◽  
U. Kretzer ◽  
...  

scholarly journals MEMS module integration into SiGe BiCMOS technology for embedded system applications

2011 ◽  
Author(s):  
M. Kaynak ◽  
M. Wietstruck ◽  
W. Zhang ◽  
J. Drews ◽  
D. Knoll ◽  
...  
Keyword(s):  
Embedded System ◽  
Bicmos Technology ◽  
Sige Bicmos

A flexible InGaZnO based 1-bit SRAM under mechanical strain

2011 ◽  
Author(s):  
Niko Munzenrieder ◽  
Christoph Zysset ◽  
Thomas Kinkeldei ◽  
Kunigunde Cherenack ◽  
Gerhard Troster
Keyword(s):  
Mechanical Strain

Computational study of carrier injection in III-nitride core-shell nanowire-LEDs

2011 ◽  
Author(s):  
Marcus Deppner ◽  
Friedhard Romer ◽  
Bernd Witzigmann ◽  
Johannes Ledig ◽  
Richard Neumann ◽  
...  
Keyword(s):  
Computational Study ◽  
Core Shell ◽  
Carrier Injection

FEM simulation and its application in MEMS design

2011 ◽  
Author(s):  
Chenping Jia ◽  
Danny Reuter ◽  
Zhiyu Wen ◽  
Mario Baum ◽  
Maik Wiemer ◽  
...  
Keyword(s):  
Fem Simulation
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