2017 Symposium on VLSI Technology
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99
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11
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9784863486058
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Key process steps for high performance and reliable 3D Sequential Integration

2017 ◽  
Author(s):  
C.-M. V. Lu ◽  
F. Deprat ◽  
C. Fenouillet-Beranger ◽  
P. Batude ◽  
X. Garros ◽  
...  
Keyword(s):  
High Performance

Privacy and security: Key requirements for sustainable IoT growth

2017 ◽  
Author(s):  
Fari Assaderaghi ◽  
Gowri Chindalore ◽  
Brima Ibrahim ◽  
Hans de Jong ◽  
Marc Joye ◽  
...  
Keyword(s):  
Privacy And Security

On-die 16nm metal critical peak current test methodology with 100ps pulse width

2017 ◽  
Author(s):  
Yu-Tao Yang ◽  
Wen-Shen Chou ◽  
Ming-Hsien Lin ◽  
Po-Zeng Kang ◽  
A. S. Oates ◽  
...  
Keyword(s):  
Pulse Width ◽  
Peak Current ◽  
Current Test ◽  
Test Methodology

Low-variation SRAM bitcells in 22nm FDSOI technology

2017 ◽  
Author(s):  
V. Joshi ◽  
H. Ramamurthy ◽  
S. Balasubramanian ◽  
S. Seo ◽  
H. Yoon ◽  
...  

High-speed and logic-compatible split-gate embedded flash on 28-nm low-power HKMG logic process

2017 ◽  
Author(s):  
Yong Kyu Lee ◽  
Changmin Jeon ◽  
Hongkook Min ◽  
Boyoung Seo ◽  
Kwangtae Kim ◽  
...  
Keyword(s):  
Low Power ◽  
High Speed ◽  
Logic Process ◽  
Embedded Flash ◽  
28 Nm
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