Surface Science Tools for Nanomaterials Characterization
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Published By Springer Berlin Heidelberg

9783662445501, 9783662445518

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology

Surface Science Tools for Nanomaterials Characterization ◽

10.1007/978-3-662-44551-8_4 ◽

2015 ◽

pp. 117-158 ◽

Cited By ~ 2

Author(s):

Da Luo ◽

Hao Sun ◽

Yan Li

Keyword(s):

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Nanoscience And Nanotechnology

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Applications of Synchrotron-Based X-Ray Photoelectron Spectroscopy in the Characterization of Nanomaterials

Surface Science Tools for Nanomaterials Characterization ◽

10.1007/978-3-662-44551-8_9 ◽

2015 ◽

pp. 317-366 ◽

Cited By ~ 3

Author(s):

W. H. Doh ◽

V. Papaefthimiou ◽

S. Zafeiratos

Keyword(s):

Photoelectron Spectroscopy ◽

X Ray

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Exploration into the Valence Band Structures of Organic Semiconductors by Angle-Resolved Photoelectron Spectroscopy

Surface Science Tools for Nanomaterials Characterization ◽

10.1007/978-3-662-44551-8_10 ◽

2015 ◽

pp. 367-404 ◽

Cited By ~ 1

Author(s):

Yasuo Nakayama ◽

Hisao Ishii

Keyword(s):

Valence Band ◽

Organic Semiconductors ◽

Photoelectron Spectroscopy ◽

Band Structures

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Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)

Surface Science Tools for Nanomaterials Characterization ◽

10.1007/978-3-662-44551-8_1 ◽

2015 ◽

pp. 1-67 ◽

Cited By ~ 1

Author(s):

Max Herpich ◽

Jochen Friedl ◽

Ulrich Stimming

Keyword(s):

Electrochemical Potential

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Numerical and Finite Element Simulations of Nanotips for FIM/FEM

Surface Science Tools for Nanomaterials Characterization ◽

10.1007/978-3-662-44551-8_16 ◽

2015 ◽

pp. 621-643 ◽

Cited By ~ 1

Author(s):

Moh’d Rezeq ◽

Ahmed E. Ali ◽

Dirar Homouz

Keyword(s):

Finite Element ◽

Finite Element Simulations

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Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Three-Dimensional Magnetic Nanostructures

Surface Science Tools for Nanomaterials Characterization ◽

10.1007/978-3-662-44551-8_14 ◽

2015 ◽

pp. 531-559

Author(s):

Amalio Fernández-Pacheco ◽

Russell P. Cowburn ◽

Luis E. Serrano-Ramón ◽

M. Ricardo Ibarra ◽

José M. De Teresa

Keyword(s):

Magnetic Force Microscopy ◽

Magnetic Force ◽

Three Dimensional ◽

Magnetic Nanostructures ◽

Force Microscopy

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Scanning Conductive Torsion Mode Microscopy

Surface Science Tools for Nanomaterials Characterization ◽

10.1007/978-3-662-44551-8_6 ◽

2015 ◽

pp. 199-225

Author(s):

Ling Sun ◽

Elmar Bonaccurso

Keyword(s):

Torsion Mode

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High Resolution STM Imaging

Surface Science Tools for Nanomaterials Characterization ◽

10.1007/978-3-662-44551-8_15 ◽

2015 ◽

pp. 561-619

Author(s):

Alexander N. Chaika

Keyword(s):

High Resolution

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Field Ion Microscopy for the Characterization of Scanning Probes

Surface Science Tools for Nanomaterials Characterization ◽

10.1007/978-3-662-44551-8_5 ◽

2015 ◽

pp. 159-198 ◽

Cited By ~ 1

Author(s):

William Paul ◽

Peter Grütter

Keyword(s):

Field Ion Microscopy ◽

Scanning Probes ◽

Ion Microscopy

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Scanning Probe Microscopy for Nanolithography

Surface Science Tools for Nanomaterials Characterization ◽

10.1007/978-3-662-44551-8_3 ◽

2015 ◽

pp. 91-115

Author(s):

C. B. Samantaray

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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Surface Science Tools for Nanomaterials CharacterizationLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology

Applications of Synchrotron-Based X-Ray Photoelectron Spectroscopy in the Characterization of Nanomaterials

Exploration into the Valence Band Structures of Organic Semiconductors by Angle-Resolved Photoelectron Spectroscopy

Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)

Numerical and Finite Element Simulations of Nanotips for FIM/FEM

Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Three-Dimensional Magnetic Nanostructures

Scanning Conductive Torsion Mode Microscopy

High Resolution STM Imaging

Field Ion Microscopy for the Characterization of Scanning Probes

Scanning Probe Microscopy for Nanolithography

Surface Science Tools for Nanomaterials Characterization
Latest Publications