Mitigating Tin Whisker Risks
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Published By John Wiley & Sons, Inc

9781119011965, 9780470907238
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Quantitative Assessment of Stress Relaxation in Tin Films by the Formation of Whiskers, Hillocks, and Other Surface Defects

2016 ◽  
pp. 187-214
Author(s):  
Nicholas G. Clore ◽  
Dennis D. Fritz ◽  
Wei-Hsun Chen ◽  
Maureen E. Williams ◽  
John E. Blendell ◽  
...  
Keyword(s):  
Stress Relaxation ◽  
Quantitative Assessment ◽  
Surface Defects ◽  
Tin Films ◽  
Assessment Of Stress

A Predictive Model for Whisker Formation Based on Local Microstructure and Grain Boundary Properties

2016 ◽  
pp. 1-20
Author(s):  
Pylin Sarobol ◽  
Ying Wang ◽  
Wei-Hsun Chen ◽  
Aaron E. Pedigo ◽  
John P. Koppes ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Predictive Model ◽  
Whisker Formation ◽  
Boundary Properties

Mechanically Induced Tin Whiskers

2016 ◽  
pp. 225-248
Author(s):  
Tadahiro Shibutani ◽  
Michael Osterman
Keyword(s):  
Tin Whiskers
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