9th International Symposium on Quality Electronic Design (isqed 2008)
Latest Publications

TOTAL DOCUMENTS

183

(FIVE YEARS 0)

H-INDEX

12

(FIVE YEARS 0)

Published By IEEE

9780769531175

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Tutorial 1: The Promise of High-k/Metal Gates-From Electronic Transport Phenomena to Emerging Device/Circuit Applications

9th International Symposium on Quality Electronic Design (isqed 2008) ◽

10.1109/isqed.2008.4479684 ◽

2008 ◽

Author(s):

K. Maitra

Keyword(s):

Electronic Transport ◽

Transport Phenomena ◽

Metal Gates ◽

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Accelerating Clock Mesh Simulation Using Matrix-Level Macromodels and Dynamic Time Step Rounding

9th International Symposium on Quality Electronic Design (isqed 2008) ◽

10.1109/isqed.2008.4479810 ◽

2008 ◽

Author(s):

Xiaoji Ye ◽

Min Zhao ◽

Rajendran Panda ◽

Peng Li ◽

Jiang Hu

Keyword(s):

Time Step ◽

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A Built-in Test and Characterization Method for Circuit Marginality Related Failures

9th International Symposium on Quality Electronic Design (isqed 2008) ◽

10.1109/isqed.2008.4479847 ◽

2008 ◽

Author(s):

Alodeep Sanyal ◽

Sandip Kundu

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Thermal Aware Global Routing of VLSI Chips for Enhanced Reliability

9th International Symposium on Quality Electronic Design (isqed 2008) ◽

10.1109/isqed.2008.4479779 ◽

2008 ◽

Author(s):

Aseem Gupta ◽

Nikil D. Dutt ◽

Fadi J. Kurdahi ◽

Kamal S. Khouri ◽

Magdy S. Abadir

Keyword(s):

Global Routing ◽

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A Statistical Characterization of CMOS Process Fluctuations in Subthreshold Current Mirrors

9th International Symposium on Quality Electronic Design (isqed 2008) ◽

10.1109/isqed.2008.4479717 ◽

2008 ◽

Author(s):

Lei Zhang ◽

Zhiping Yu ◽

Xiangqing He

Keyword(s):

Cmos Process ◽

Statistical Characterization ◽

Subthreshold Current ◽

Current Mirrors

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Cache Design for Low Power and High Yield

9th International Symposium on Quality Electronic Design (isqed 2008) ◽

10.1109/isqed.2008.4479707 ◽

2008 ◽

Author(s):

Baker Mohammad ◽

Martin Saint-Laurent ◽

Paul Bassett ◽

Jacob Abraham

Keyword(s):

Low Power ◽

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Architecting for Physical Verification Performance and Scaling

9th International Symposium on Quality Electronic Design (isqed 2008) ◽

10.1109/isqed.2008.4479740 ◽

2008 ◽

Author(s):

John Ferguson ◽

Robert Todd

Keyword(s):

Physical Verification

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An On-Demand Test Triggering Mechanism for NoC-Based Safety-Critical Systems

9th International Symposium on Quality Electronic Design (isqed 2008) ◽

10.1109/isqed.2008.4479723 ◽

2008 ◽

Author(s):

Jason D. Lee ◽

Nikhil Gupta ◽

Praveen S. Bhojwani ◽

Rabi N. Mahapatra

Keyword(s):

Critical Systems ◽

Triggering Mechanism ◽

Safety Critical ◽

On Demand ◽

Safety Critical Systems

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Error Protected Data Bus Inversion Using Standard DRAM Components

9th International Symposium on Quality Electronic Design (isqed 2008) ◽

10.1109/isqed.2008.4479694 ◽

2008 ◽

Author(s):

Maurzio Skerlj ◽

Paolo Ienne

Keyword(s):

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Tutorial 5: Caches in the Many-Core Era: What Purpose Might eDRAM Serve?

9th International Symposium on Quality Electronic Design (isqed 2008) ◽

10.1109/isqed.2008.4479688 ◽

2008 ◽

Author(s):

Hillary Hunter

Keyword(s):

The Many ◽

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