International Technical Digest on Electron Devices Meeting
Latest Publications

TOTAL DOCUMENTS

247

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

0780308174

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Field emission imaging study of silicon field emitters

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307380 ◽

1992 ◽

Author(s):

Jiang Liu ◽

Hren ◽

Sune ◽

Jones ◽

Gray

Keyword(s):

Field Emission ◽

Imaging Study ◽

Field Emitters

Quasi-SOI MOSFETs using selective epitaxy and polishing

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307374 ◽

1992 ◽

Cited By ~ 18

Author(s):

Nguyen ◽

Kuehne ◽

Renteln ◽

Wong

Keyword(s):

Selective Epitaxy

Hot-carrier degradation of p-MOSFET's in analog operation: the relevance of the channel-length-independent drain conductance degradation

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307417 ◽

1992 ◽

Cited By ~ 2

Author(s):

Thewes ◽

Brox ◽

Tempel ◽

Weber ◽

Goser

Keyword(s):

Channel Length ◽

Hot Carrier ◽

Drain Conductance ◽

Hot Carrier Degradation

New CMOS shallow junction well FET structure (CMOS-SJET) for low power-supply voltage

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307504 ◽

1992 ◽

Cited By ~ 11

Author(s):

Yoshimura ◽

Matsuoka ◽

Kakumu

Keyword(s):

Low Power ◽

Power Supply ◽

Supply Voltage ◽

Power Supply Voltage ◽

Shallow Junction

The double-cusp gyro-gun

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307346 ◽

1992 ◽

Cited By ~ 8

Author(s):

Nguyen ◽

Smithe ◽

Ludeking

Universal description of hot-carrier-induced interface states in NMOSFETs

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307418 ◽

1992 ◽

Cited By ~ 15

Author(s):

Woltjer ◽

Paulzen

Keyword(s):

Interface States ◽

Hot Carrier

Phase-shifting mask topography effects on lithographic image quality

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307307 ◽

1992 ◽

Cited By ~ 8

Author(s):

Pierrat ◽

Wong ◽

Vaidya

Keyword(s):

Image Quality ◽

Phase Shifting

A novel electron emitter with AlGaAs planar doped barrier

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307522 ◽

1992 ◽

Author(s):

Jiang ◽

Mishra

Keyword(s):

Electron Emitter

Challenges in excimer laser lithography for 256M DRAM and beyond

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307305 ◽

1992 ◽

Cited By ~ 2

Author(s):

Endo ◽

Hashimoto ◽

Yamashita ◽

Katsuyama ◽

Matsuo ◽

...

Keyword(s):

Excimer Laser ◽

Laser Lithography

Jitter suppression in a CFA by the use of a field emitter array

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307511 ◽

1992 ◽

Author(s):

Vaughan ◽

Ramacher ◽

Bergeron

Keyword(s):

Field Emitter ◽

Emitter Array ◽

Field Emitter Array

International Technical Digest on Electron Devices MeetingLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Field emission imaging study of silicon field emitters

Quasi-SOI MOSFETs using selective epitaxy and polishing

Hot-carrier degradation of p-MOSFET's in analog operation: the relevance of the channel-length-independent drain conductance degradation

New CMOS shallow junction well FET structure (CMOS-SJET) for low power-supply voltage

The double-cusp gyro-gun

Universal description of hot-carrier-induced interface states in NMOSFETs

Phase-shifting mask topography effects on lithographic image quality

A novel electron emitter with AlGaAs planar doped barrier

Challenges in excimer laser lithography for 256M DRAM and beyond

Jitter suppression in a CFA by the use of a field emitter array

International Technical Digest on Electron Devices Meeting
Latest Publications