Hot-carrier degradation of p-MOSFET's in analog operation: the relevance of the channel-length-independent drain conductance degradation
1995 ◽
Vol 38
(1)
◽
pp. 183-187
◽
Keyword(s):
Keyword(s):
1991 ◽
Vol 15
(1-4)
◽
pp. 429-432
◽
Keyword(s):
1993 ◽
Vol 140
(6)
◽
pp. 431
◽
Keyword(s):
1988 ◽
Vol 49
(C4)
◽
pp. C4-651-C4-655
◽
1988 ◽
Vol 49
(C4)
◽
pp. C4-787-C4-790