Crystalline Silicon - Properties and Uses
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15

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4

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9789533075877

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Global Flow Analysis of Crystalline Silicon

Crystalline Silicon - Properties and Uses ◽

10.5772/23573 ◽

2011 ◽

Author(s):

Hiroaki Takiguchi

Keyword(s):

Crystalline Silicon ◽

Flow Analysis ◽

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Silicon Nanocluster in Silicon Dioxide: Cathodoluminescence, Energy Dispersive X-Ray Analysis and Infrared Spectroscopy Studies

Crystalline Silicon - Properties and Uses ◽

10.5772/35404 ◽

2011 ◽

Author(s):

Roushdey Salh

Keyword(s):

Infrared Spectroscopy ◽

Silicon Dioxide ◽

Energy Dispersive ◽

X Ray ◽

Spectroscopy Studies

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Study of SiO2/Si Interface by Surface Techniques

Crystalline Silicon - Properties and Uses ◽

10.5772/23174 ◽

2011 ◽

Author(s):

Rodica Ghita ◽

Constantin Logofatu ◽

Catalin-Constantin Negrila ◽

Florica Ungureanu ◽

Costel Cotirlan ◽

...

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Nanocrystalline Porous Silicon: Structural, Optical, Electrical and Photovoltaic Properties

Crystalline Silicon - Properties and Uses ◽

10.5772/20683 ◽

2011 ◽

Author(s):

Ma. Concepcin ◽

Marina ◽

Omar Martinez ◽

Oscar H.

Keyword(s):

Porous Silicon ◽

Photovoltaic Properties

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MEMS Silicon Microphone

Crystalline Silicon - Properties and Uses ◽

10.5772/21277 ◽

2011 ◽

Author(s):

Bahram Azizollah

Keyword(s):

Silicon Microphone

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Porous Silicon Integrated Photonic Devices for Biochemical Optical Sensing

Crystalline Silicon - Properties and Uses ◽

10.5772/20782 ◽

2011 ◽

Author(s):

Emanuele Orabona ◽

Ivo Rendina ◽

Luca De ◽

Ilaria Re

Keyword(s):

Porous Silicon ◽

Optical Sensing ◽

Photonic Devices

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High Mass Molecular Ion Implantation for Advanced Logic and Memory Devices Manufacturing

Crystalline Silicon - Properties and Uses ◽

10.5772/24194 ◽

2011 ◽

Author(s):

Bill Chang ◽

Michael Amee

Keyword(s):

Ion Implantation ◽

High Mass ◽

Memory Devices ◽

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Infrared Spectroscopic Ellipsometry for Ion-Implanted Silicon Wafers

Crystalline Silicon - Properties and Uses ◽

10.5772/23438 ◽

2011 ◽

Author(s):

Li ◽

Xianming Liu

Keyword(s):

Spectroscopic Ellipsometry ◽

Silicon Wafers ◽

Infrared Spectroscopic ◽

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Life Cycle Assessment of PV systems

Crystalline Silicon - Properties and Uses ◽

10.5772/23134 ◽

2011 ◽

Author(s):

Masakazu Ito

Keyword(s):

Life Cycle Assessment ◽

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Nanocrystalline Porous Silicon

Crystalline Silicon - Properties and Uses ◽

10.5772/23355 ◽

2011 ◽

Author(s):

Sukumar Basu ◽

Jayita Kanungo

Keyword(s):

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