Fundamentals of Nanoscale Film Analysis
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Published By Springer US

9780387292601

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Photon Absorption in Solids and EXAFS

Fundamentals of Nanoscale Film Analysis ◽

10.1007/978-0-387-29261-8_9 ◽

2007 ◽

pp. 174-198

Keyword(s):

Photon Absorption

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Electron-Electron Interactions and the Depth Sensitivity of Electron Spectroscopies

Fundamentals of Nanoscale Film Analysis ◽

10.1007/978-0-387-29261-8_6 ◽

2007 ◽

pp. 105-128

Keyword(s):

Depth Sensitivity ◽

Electron Interactions

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Radiative Transitions and the Electron Microprobe

Fundamentals of Nanoscale Film Analysis ◽

10.1007/978-0-387-29261-8_11 ◽

2007 ◽

pp. 214-233

Keyword(s):

Electron Microprobe ◽

Radiative Transitions

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Nonradiative Transitions and Auger Electron Spectroscopy

Fundamentals of Nanoscale Film Analysis ◽

10.1007/978-0-387-29261-8_12 ◽

2007 ◽

pp. 234-254

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Nonradiative Transitions

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X-ray Diffraction

Fundamentals of Nanoscale Film Analysis ◽

10.1007/978-0-387-29261-8_7 ◽

2007 ◽

pp. 129-151

Keyword(s):

X Ray Diffraction ◽

X Ray

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Ion Channeling

Fundamentals of Nanoscale Film Analysis ◽

10.1007/978-0-387-29261-8_5 ◽

2007 ◽

pp. 84-104

Keyword(s):

Ion Channeling

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Atomic Collisions and Backscattering Spectrometry

Fundamentals of Nanoscale Film Analysis ◽

10.1007/978-0-387-29261-8_2 ◽

2007 ◽

pp. 12-33

Keyword(s):

Atomic Collisions

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Sputter Depth Profiles and Secondary Ion Mass Spectroscopy

Fundamentals of Nanoscale Film Analysis ◽

10.1007/978-0-387-29261-8_4 ◽

2007 ◽

pp. 59-83

Keyword(s):

Mass Spectroscopy ◽

Secondary Ion Mass Spectroscopy ◽

Depth Profiles ◽

Secondary Ion

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Scanning Probe Microscopy

Fundamentals of Nanoscale Film Analysis ◽

10.1007/978-0-387-29261-8_14 ◽

2007 ◽

pp. 277-290

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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Electron Diffraction

Fundamentals of Nanoscale Film Analysis ◽

10.1007/978-0-387-29261-8_8 ◽

2007 ◽

pp. 152-173

Keyword(s):

Electron Diffraction

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