Semiconductor Silicon - Springer Series in Materials Science
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Published By Springer Berlin Heidelberg

9783642747250, 9783642747236

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Crystalline Silicon Solar Cells

Semiconductor Silicon - Springer Series in Materials Science ◽

10.1007/978-3-642-74723-6_27 ◽

1994 ◽

pp. 339-344

Author(s):

R. Mertens

Keyword(s):

Solar Cells ◽

Crystalline Silicon ◽

Silicon Solar Cells ◽

Crystalline Silicon Solar Cells

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Theory of Defects in Crystalline Silicon

Semiconductor Silicon - Springer Series in Materials Science ◽

10.1007/978-3-642-74723-6_9 ◽

1989 ◽

pp. 112-126

Author(s):

M. A. Schlüter

Keyword(s):

Crystalline Silicon

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Chemical and Physical Considerations in the Chemical Vapor Deposition Process

Semiconductor Silicon - Springer Series in Materials Science ◽

10.1007/978-3-642-74723-6_2 ◽

1989 ◽

pp. 24-35

Author(s):

B. S. Meyerson

Keyword(s):

Chemical Vapor Deposition ◽

Vapor Deposition ◽

Chemical Vapor ◽

Deposition Process ◽

Chemical Vapor Deposition Process ◽

Vapor Deposition Process

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High Resolution Electron Microscopy of Defects in Silicon

Semiconductor Silicon - Springer Series in Materials Science ◽

10.1007/978-3-642-74723-6_12 ◽

1989 ◽

pp. 160-173

Author(s):

J. Thibault-Desseaux

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

High Resolution Electron Microscopy ◽

Resolution Electron

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Low Temperature Epitaxial Crystallization of Amorphous Si by Ion-Beam Irradiation

Semiconductor Silicon - Springer Series in Materials Science ◽

10.1007/978-3-642-74723-6_7 ◽

1989 ◽

pp. 100-103

Author(s):

F. Priolo ◽

A. La Ferla ◽

E. Rimini

Keyword(s):

Low Temperature ◽

Ion Beam ◽

Beam Irradiation ◽

Ion Beam Irradiation ◽

Epitaxial Crystallization ◽

Amorphous Si

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Ion Implantation

Semiconductor Silicon - Springer Series in Materials Science ◽

10.1007/978-3-642-74723-6_6 ◽

1989 ◽

pp. 84-99 ◽

Cited By ~ 1

Author(s):

J. M. Poate

Keyword(s):

Ion Implantation

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Technology and Reliability Problems of Trench Cell Capacitors

Semiconductor Silicon - Springer Series in Materials Science ◽

10.1007/978-3-642-74723-6_24 ◽

1989 ◽

pp. 298-308

Author(s):

S. Röhl

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Scanning Minority Carrier Transient Spectroscopy: A Method to Investigate the Lateral Distribution of Defects in Semiconductors

Semiconductor Silicon - Springer Series in Materials Science ◽

10.1007/978-3-642-74723-6_14 ◽

1989 ◽

pp. 184-188

Author(s):

A. Mesli ◽

T. Heiser

Keyword(s):

Minority Carrier ◽

Lateral Distribution ◽

Transient Spectroscopy ◽

Defects In Semiconductors

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Tunneling Microscopy and Surface Analysis

Semiconductor Silicon - Springer Series in Materials Science ◽

10.1007/978-3-642-74723-6_13 ◽

1989 ◽

pp. 174-183

Author(s):

H. W. M. Salemink

Keyword(s):

Surface Analysis ◽

Tunneling Microscopy

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Defects in CZ Silicon

Semiconductor Silicon - Springer Series in Materials Science ◽

10.1007/978-3-642-74723-6_10 ◽

1989 ◽

pp. 127-152 ◽

Cited By ~ 2

Author(s):

W. Zulehner

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Semiconductor Silicon - Springer Series in Materials ScienceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Crystalline Silicon Solar Cells

Theory of Defects in Crystalline Silicon

Chemical and Physical Considerations in the Chemical Vapor Deposition Process

High Resolution Electron Microscopy of Defects in Silicon

Low Temperature Epitaxial Crystallization of Amorphous Si by Ion-Beam Irradiation

Ion Implantation

Technology and Reliability Problems of Trench Cell Capacitors

Scanning Minority Carrier Transient Spectroscopy: A Method to Investigate the Lateral Distribution of Defects in Semiconductors

Tunneling Microscopy and Surface Analysis

Defects in CZ Silicon

Semiconductor Silicon - Springer Series in Materials Science
Latest Publications