MEMS and Nanotechnology, Volume 6 - Conference Proceedings of the Society for Experimental Mechanics Series
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Published By Springer New York

9781461444350, 9781461444367

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Stiction Failure in Microswitches Due to Elasto-Plastic Adhesive Contacts

MEMS and Nanotechnology, Volume 6 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-1-4614-4436-7_11 ◽

2012 ◽

pp. 67-74 ◽

Cited By ~ 1

Author(s):

Ling Wu ◽

Jean-Claude Golinval ◽

Ludovic Noels

Keyword(s):

Adhesive Contacts

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Simultaneous Measurement of Force and Conductance Across Single Molecule Junctions

MEMS and Nanotechnology, Volume 6 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-1-4614-4436-7_12 ◽

2012 ◽

pp. 75-84

Author(s):

Sriharsha V. Aradhya ◽

Michael Frei ◽

Mark S. Hybertsen ◽

Latha Venkataraman

Keyword(s):

Single Molecule ◽

Simultaneous Measurement ◽

Single Molecule Junctions

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Frequency Multiplication and Demultiplication in MEMS

MEMS and Nanotechnology, Volume 6 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-1-4614-4436-7_9 ◽

2012 ◽

pp. 53-58

Author(s):

David B. Blocher ◽

Alan T. Zehnder ◽

Richard H. Rand

Keyword(s):

Frequency Multiplication

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Hardening Behaviour of Thin Wires Under Loading with Strain Gradients

MEMS and Nanotechnology, Volume 6 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-1-4614-4436-7_17 ◽

2012 ◽

pp. 119-124

Author(s):

Ying Chen ◽

Mario Walter ◽

Oliver Kraft

Keyword(s):

Strain Gradients ◽

Thin Wires

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Strain-Rate Sensitivity (SRS) of Nickel by Instrumented Indentation

MEMS and Nanotechnology, Volume 6 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-1-4614-4436-7_8 ◽

2012 ◽

pp. 47-52 ◽

Cited By ~ 2

Author(s):

Jennifer Hay ◽

Verena Maier ◽

Karsten Durst ◽

Mathias Göken

Keyword(s):

Strain Rate ◽

Strain Rate Sensitivity ◽

Rate Sensitivity ◽

Instrumented Indentation

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Hydrodynamic Force Compensation for Single-Molecule Mechanical Testing Using Colloidal Probe Atomic Force Microscopy

MEMS and Nanotechnology, Volume 6 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-1-4614-4436-7_6 ◽

2012 ◽

pp. 37-40

Author(s):

Gordon A. Shaw

Keyword(s):

Atomic Force Microscopy ◽

Mechanical Testing ◽

Single Molecule ◽

Hydrodynamic Force ◽

Colloidal Probe ◽

Force Microscopy ◽

Atomic Force ◽

Force Compensation

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Detection of Damage of Epoxy Composites Using Carbon Nanotube Network

MEMS and Nanotechnology, Volume 6 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-1-4614-4436-7_22 ◽

2012 ◽

pp. 149-154

Author(s):

S. Cardoso ◽

C. Mooney ◽

R. Pivonka ◽

V. B. Chalivendra ◽

A. Shukla ◽

...

Keyword(s):

Carbon Nanotube ◽

Epoxy Composites ◽

Carbon Nanotube Network

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Global Digital Image Correlation for Pressure Deflected Membranes

MEMS and Nanotechnology, Volume 6 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-1-4614-4436-7_20 ◽

2012 ◽

pp. 135-140

Author(s):

Jan Neggers ◽

Johan Hoefnagels ◽

François Hild ◽

Stéphane Roux ◽

Marc Geers

Keyword(s):

Digital Image Correlation ◽

Digital Image ◽

Image Correlation

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High Speed Magnetic Tweezers at 10,000fps with Reflected Hg-Lamp Illumination

MEMS and Nanotechnology, Volume 6 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-1-4614-4436-7_13 ◽

2012 ◽

pp. 85-91

Author(s):

Bob M. Lansdorp ◽

Omar A. Saleh

Keyword(s):

High Speed ◽

Magnetic Tweezers ◽

Lamp Illumination

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Silicon Carbide High Temperature MEMS Capacitive Strain Sensor

MEMS and Nanotechnology, Volume 6 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-1-4614-4436-7_1 ◽

2012 ◽

pp. 1-9

Author(s):

R. P. Weisenberger ◽

R. A. Coutu ◽

LaVern A. Starman

Keyword(s):

Silicon Carbide ◽

High Temperature ◽

Strain Sensor ◽

Capacitive Strain

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MEMS and Nanotechnology, Volume 6 - Conference Proceedings of the Society for Experimental Mechanics SeriesLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer New York

Stiction Failure in Microswitches Due to Elasto-Plastic Adhesive Contacts

Simultaneous Measurement of Force and Conductance Across Single Molecule Junctions

Frequency Multiplication and Demultiplication in MEMS

Hardening Behaviour of Thin Wires Under Loading with Strain Gradients

Strain-Rate Sensitivity (SRS) of Nickel by Instrumented Indentation

Hydrodynamic Force Compensation for Single-Molecule Mechanical Testing Using Colloidal Probe Atomic Force Microscopy

Detection of Damage of Epoxy Composites Using Carbon Nanotube Network

Global Digital Image Correlation for Pressure Deflected Membranes

High Speed Magnetic Tweezers at 10,000fps with Reflected Hg-Lamp Illumination

Silicon Carbide High Temperature MEMS Capacitive Strain Sensor

MEMS and Nanotechnology, Volume 6 - Conference Proceedings of the Society for Experimental Mechanics Series
Latest Publications