Sixth International Symposium on Quality of Electronic Design (ISQED'05)
Latest Publications

TOTAL DOCUMENTS

131

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

0769523013

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Statistical Analysis of Clock Skew Variation in H-Tree Structure

Sixth International Symposium on Quality of Electronic Design (ISQED'05) ◽

10.1109/isqed.2005.114 ◽

2005 ◽

Cited By ~ 22

Author(s):

M. Hashimoto ◽

T. Yamamoto ◽

H. Onodera

Keyword(s):

Statistical Analysis ◽

Tree Structure ◽

Clock Skew

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A Min-Variance Iterative Method for Fast Smart Dummy Feature Density Assignment in Chemical-Mechanical Polishing

Sixth International Symposium on Quality of Electronic Design (ISQED'05) ◽

10.1109/isqed.2005.8 ◽

2005 ◽

Cited By ~ 9

Author(s):

Xin Wang ◽

C.C. Chiang ◽

J. Kawa ◽

Qing Su

Keyword(s):

Iterative Method ◽

Chemical Mechanical Polishing ◽

Mechanical Polishing

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BIST-Guided ATPG

Sixth International Symposium on Quality of Electronic Design (ISQED'05) ◽

10.1109/isqed.2005.26 ◽

2005 ◽

Cited By ~ 1

Author(s):

A.A. Al-Yamani ◽

E.J. McCluskey

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Fast Decap Allocation Algorithm For Robust On-Chip Power Delivery

Sixth International Symposium on Quality of Electronic Design (ISQED'05) ◽

10.1109/isqed.2005.57 ◽

2005 ◽

Cited By ~ 4

Author(s):

Zhenyu Qi ◽

Hang Li ◽

S.X.-D. Tan ◽

Lifeng Wu ◽

Yici Cai ◽

...

Keyword(s):

Power Delivery ◽

Allocation Algorithm ◽

On Chip

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Reduced Test Application Time Based on Reachability Analysis

Sixth International Symposium on Quality of Electronic Design (ISQED'05) ◽

10.1109/isqed.2005.102 ◽

2005 ◽

Author(s):

Th. Haniotakis ◽

S. Tragoudas ◽

G. Pani

Keyword(s):

Reachability Analysis ◽

Application Time ◽

Test Application Time ◽

Test Application

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In-Circuit Self-Tuning of Clock Latencies

Sixth International Symposium on Quality of Electronic Design (ISQED'05) ◽

10.1109/isqed.2005.65 ◽

2005 ◽

Author(s):

K. Rahimi ◽

C. Diorio

Keyword(s):

Self Tuning

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Issues and Challenges in Ramp to Production

Sixth International Symposium on Quality of Electronic Design (ISQED'05) ◽

10.1109/isqed.2005.72 ◽

2005 ◽

Author(s):

A. Shrimali ◽

A. Venkitachalam ◽

R. Arora

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Recent Progress and Remaining Challenges in Pattern Transfer Technologies for Advanced Chip Designs

Sixth International Symposium on Quality of Electronic Design (ISQED'05) ◽

10.1109/isqed.2005.101 ◽

2005 ◽

Author(s):

A.K. Sinha

Keyword(s):

Recent Progress ◽

Pattern Transfer

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A New Method for Design of Robust Digital Circuits

Sixth International Symposium on Quality of Electronic Design (ISQED'05) ◽

10.1109/isqed.2005.11 ◽

2005 ◽

Cited By ~ 32

Author(s):

D. Patil ◽

Sunghee Yun ◽

Seung-Jean Kim ◽

A. Cheung ◽

M. Horowitz ◽

...

Keyword(s):

Digital Circuits ◽

New Method

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Standard Cell Printability Grading and Hot Spot Detection

Sixth International Symposium on Quality of Electronic Design (ISQED'05) ◽

10.1109/isqed.2005.113 ◽

2005 ◽

Cited By ~ 4

Author(s):

M. Cote ◽

P. Hurat

Keyword(s):

Hot Spot ◽

Standard Cell ◽

Spot Detection

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Sixth International Symposium on Quality of Electronic Design (ISQED'05)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Statistical Analysis of Clock Skew Variation in H-Tree Structure

A Min-Variance Iterative Method for Fast Smart Dummy Feature Density Assignment in Chemical-Mechanical Polishing

BIST-Guided ATPG

Fast Decap Allocation Algorithm For Robust On-Chip Power Delivery

Reduced Test Application Time Based on Reachability Analysis

In-Circuit Self-Tuning of Clock Latencies

Issues and Challenges in Ramp to Production

Recent Progress and Remaining Challenges in Pattern Transfer Technologies for Advanced Chip Designs

A New Method for Design of Robust Digital Circuits

Standard Cell Printability Grading and Hot Spot Detection

Sixth International Symposium on Quality of Electronic Design (ISQED'05)
Latest Publications