Dimensional Optical Metrology and Inspection for Practical Applications IX
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13
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Published By SPIE

9781510635715, 9781510635722
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Toward the generation of reproducible synthetic surface data in optical metrology

2020 ◽  
Author(s):  
Jesús D. Pineda Castro ◽  
Hernando R. Altamar-Mercado ◽  
Lenny A. Romero ◽  
Andrés G. Marrugo
Keyword(s):  
Optical Metrology ◽  
Surface Data

What is the best triangulation approach for a structured light system?

2020 ◽  
Author(s):  
Jhacson Meza ◽  
Raúl Vargas ◽  
Lenny A. Romero ◽  
Song Zhang ◽  
Andrés G. Marrugo
Keyword(s):  
Structured Light ◽  
Light System ◽  
Structured Light System

Similarity evaluation of 3D topological measurement results using statistical methods

2020 ◽  
Author(s):  
Vignesh Suresh ◽  
Yi Zheng ◽  
Xiao Zhang ◽  
Shaodong Wang ◽  
Hantang Qin ◽  
...  
Keyword(s):  
Statistical Methods ◽  
Measurement Results
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