Springer Proceedings in Physics - Polycrystalline Semiconductors
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Published By Springer Berlin Heidelberg

9783642934155, 9783642934131

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Effect of the Grain Boundaries in Small Grain Polysilicon Thin Film Transistors

Springer Proceedings in Physics - Polycrystalline Semiconductors ◽

10.1007/978-3-642-93413-1_49 ◽

1989 ◽

pp. 366-369

Author(s):

A. Sakri ◽

A. Le Glaunec ◽

Y. Colin ◽

O. Bonnaud

Keyword(s):

Thin Film ◽

Grain Boundaries ◽

Thin Film Transistors

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Microstructure and Interfaces of Polysilicon in Integrated Circuits

Springer Proceedings in Physics - Polycrystalline Semiconductors ◽

10.1007/978-3-642-93413-1_48 ◽

1989 ◽

pp. 354-365 ◽

Author(s):

H. Cerva ◽

H. Oppolzer

Keyword(s):

Integrated Circuits

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Computer Modelling of Grain Boundaries by Use of Interatomic Potentials

Springer Proceedings in Physics - Polycrystalline Semiconductors ◽

10.1007/978-3-642-93413-1_4 ◽

1989 ◽

pp. 25-33 ◽

Author(s):

H. Teichler

Keyword(s):

Grain Boundaries ◽

Computer Modelling ◽

Interatomic Potentials

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Metal and Polycrystalline Silicon Reactions

Springer Proceedings in Physics - Polycrystalline Semiconductors ◽

10.1007/978-3-642-93413-1_31 ◽

1989 ◽

pp. 225-233 ◽

Author(s):

K. N. Tu ◽

T. C. Chou

Keyword(s):

Polycrystalline Silicon

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Characterization of MBE-Grown Polysilicon

Springer Proceedings in Physics - Polycrystalline Semiconductors ◽

10.1007/978-3-642-93413-1_27 ◽

1989 ◽

pp. 192-197 ◽

Author(s):

M. Kuisl ◽

U. König ◽

F. Schäffler ◽

R. Lossos

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Grain Boundary Structure Determination by HREM: A Comparison with Computer Relaxed Configurations for Pure Tilt in Germanium

Springer Proceedings in Physics - Polycrystalline Semiconductors ◽

10.1007/978-3-642-93413-1_2 ◽

1989 ◽

pp. 8-18 ◽

Author(s):

A. Bourret ◽

J. L. Rouvière

Keyword(s):

Grain Boundary ◽

Structure Determination ◽

Boundary Structure ◽

Grain Boundary Structure

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SEM-EBIC Investigations of the Electrical Activity of Grain Boundaries in Germanium

Springer Proceedings in Physics - Polycrystalline Semiconductors ◽

10.1007/978-3-642-93413-1_12 ◽

1989 ◽

pp. 89-94 ◽

Author(s):

N. Tabet ◽

C. Monty ◽

Y. Marfaing

Keyword(s):

Electrical Activity ◽

Grain Boundaries

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Intergranular Total Energy Maps and the Structure of a Grain Boundary

Springer Proceedings in Physics - Polycrystalline Semiconductors ◽

10.1007/978-3-642-93413-1_1 ◽

1989 ◽

pp. 2-7 ◽

Author(s):

E. Tarnow ◽

P. Bristowe ◽

J. D. Joannopoulos ◽

M. Payne

Keyword(s):

Grain Boundary ◽

Total Energy ◽

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The Influence of Structure and Impurity Precipitation on the Electrical Properties of the Grain Boundaries in Silicon: Copper Precipitation in the Σ = 25 Boundary

Springer Proceedings in Physics - Polycrystalline Semiconductors ◽

10.1007/978-3-642-93413-1_9 ◽

1989 ◽

pp. 64-76 ◽

Author(s):

M. Aucouturier ◽

A. Broniatowski ◽

A. Chari ◽

J. L. Maurice

Keyword(s):

Electrical Properties ◽

Grain Boundaries ◽

Copper Precipitation

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High Resolution Electron Microscopy of the Structure and Chemistry of Grain Boundaries and Other Interfaces in Semiconductors

Springer Proceedings in Physics - Polycrystalline Semiconductors ◽

10.1007/978-3-642-93413-1_6 ◽

1989 ◽

pp. 42-51 ◽

Author(s):

Y. Ishida ◽

H. Ichinose

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Grain Boundaries ◽

High Resolution Electron Microscopy ◽

Resolution Electron

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