Forces in Scanning Probe Methods
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Published By Springer Netherlands

9789401040273, 9789401100496
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Lateral Force Measurements on Phase Separated Polymer Surfaces

1995 ◽  
pp. 331-336 ◽  
Author(s):  
Makoto Motomatsu ◽  
Wataru Mizutani ◽  
Heng-Yong Nie ◽  
Hiroshi Tokumoto
Keyword(s):  
Lateral Force ◽  
Polymer Surfaces ◽  
Force Measurements

Normal and Lateral Forces in Friction Force Microscopy

1995 ◽  
pp. 319-324 ◽  
Author(s):  
M. Labardi ◽  
M. Allegrini ◽  
C. Ascoli ◽  
C. Frediani ◽  
M. Salerno
Keyword(s):  
Friction Force ◽  
Friction Force Microscopy ◽  
Force Microscopy ◽  
Lateral Forces

Molecular Scale Study of Domain Boundaries and Frictional Stick-Slip Motion on Lipid Bilayers

1995 ◽  
pp. 307-312 ◽  
Author(s):  
R. M. Overney ◽  
H. Takano ◽  
M. Fujihira ◽  
G. Overney ◽  
W. Paulus ◽  
...  
Keyword(s):  
Lipid Bilayers ◽  
Stick Slip ◽  
Domain Boundaries ◽  
Molecular Scale ◽  
Stick Slip Motion ◽  
Slip Motion

Atomistic Theory of the Interaction Between AFM Tips and Ionic Surfaces

1995 ◽  
pp. 169-174
Author(s):  
A. L. Shluger ◽  
A. L. Rohl ◽  
D. H. Gay ◽  
R. T. Williams
Keyword(s):  
Afm Tips

Controlled Motion of Xe Atom on Metal Surfaces

1995 ◽  
pp. 149-155
Author(s):  
A. Buldum ◽  
S. Ciraci ◽  
Ş. Erkoç
Keyword(s):  
Metal Surfaces ◽  
Controlled Motion

Effect of Overlayer Thickness on the Nanoindentation of SiO2 /Si

1995 ◽  
pp. 85-90 ◽  
Author(s):  
Charles F. Draper ◽  
David M. Schaefer ◽  
Richard J. Colton ◽  
Steven M. Hues
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