Atomistic Theory of the Interaction Between AFM Tips and Ionic Surfaces

1995 ◽  
pp. 169-174
Author(s):  
A. L. Shluger ◽  
A. L. Rohl ◽  
D. H. Gay ◽  
R. T. Williams
Keyword(s):  
Author(s):  
Raymond A. Lee ◽  
Patrick J. Wolpert

Abstract FIB Micromachining has long been an established technique, but until recently it has been overshadowed by the more mainstream semiconductor application of the Focused Ion Beam system. Nano- Structure fabrication using the FIB system has become more popular recently due to several factors. The need for sub-micron structures have grown significantly due to a need for enhanced optical and biological applications. Another reason for the growth in micromachining is the improvement made in the ability of FIB systems to produce geometric shapes with high precision. With the latest high-end FIB systems, it is possible to produce microstructures with tens of nano-meters of precision. Optical lens, AFM tips, and nano-apertures are all part of the growing application for FIB Micromachining. This paper will discuss the ability and limitations of the FIB system and some possible application for FIB Micromachining.


2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Yawar Abbas ◽  
Ayman Rezk ◽  
Fatmah Alkindi ◽  
Irfan Saadat ◽  
Ammar Nayfeh ◽  
...  
Keyword(s):  

An amendment to this paper has been published and can be accessed via a link at the top of the paper.


Langmuir ◽  
1997 ◽  
Vol 13 (21) ◽  
pp. 5691-5696 ◽  
Author(s):  
M. C. Guffond ◽  
D. R. M. Williams ◽  
E. M. Sevick

1995 ◽  
Author(s):  
Michel Castagne ◽  
Christel Prioleau ◽  
Jean-Pierre Fillard ◽  
E. Baudry

2015 ◽  
Vol 335 ◽  
pp. 11-16 ◽  
Author(s):  
Jianxun Xu ◽  
Yoshitaka Shingaya ◽  
Yuliang Zhao ◽  
Tomonobu Nakayama

2020 ◽  
Author(s):  
Hongyu Gao ◽  
James Ewen ◽  
Remco Hartkamp ◽  
Martin H. Müser ◽  
Daniele Dini

<div>Surfactant molecules, known as organic friction modifiers (OFMs), are added to lubricants to reduce friction and wear between sliding surfaces. In macroscale experiments, friction generally decreases as the coverage of OFM molecules on the sliding surfaces increases. However, recent nanoscale experiments with sharp atomic force microscopy (AFM) tips have shown increasing friction. To elucidate the origin of these opposite trends, we use nonequilibrium molecular dynamics (NEMD) simulations and study kinetic friction between OFM monolayers and an indenting nanoscale asperity. For this purpose, we study various coverages of stearamide OFMs on iron oxide surfaces and silica AFM tips with different radii of curvature. For our small tip radii, the friction coefficient and indentation depth both have a non-monotonic dependence on OFM surface coverage, with maxima occurring at intermediate coverage. This suggests that friction is dominated by plowing. We rationalise the non-monotonic relations through a competition of two effects (confinement and packing density) that varying the surface coverage has on the effective stiffness of the OFM monolayers. We also show that kinetic friction is not very sensitive to the sliding velocity in the range studied, indicating that it originates from instabilities. Indeed, while friction predominately originates from the plowing action of the monolayers by the leading edge of the tip, thermal dissipation is mostly localised in molecules towards the trailing edge of the tip.</div>


2012 ◽  
Vol 22 (25) ◽  
pp. 12682 ◽  
Author(s):  
Michael E. Drew ◽  
Andrew R. Konicek ◽  
Papot Jaroenapibal ◽  
Robert W. Carpick ◽  
Yoko Yamakoshi

2001 ◽  
Vol 7 (S2) ◽  
pp. 1236-1237
Author(s):  
Shelley R. Gilliss ◽  
Jeffrey K. Fairer ◽  
N. Ravishankar ◽  
Mark G. Schwabel ◽  
C. Barry Carter

Cerium oxide is widely used for chemomechanical polishing (CMP) of silicate glasses. Uses include finishing of optical elements and planarizing dielectrics in the semiconductor industry. This study is designed to investigate the fundamentals of the cerium oxide/silica CMP process by measuring the interaction force between silicate glasses and cerium oxide. Surface forces involved in the polishing of glass by a cerium oxide abrasive can be studied in a controlled manner by measuring sample-tip interactions between a glass substrate and a cerium oxide tip in an atomic force microscope (AFM). Commercially available AFM tips have been coated with thin, uniform films of cerium oxide. By using a square pyramid tip as a template for the shape of the cerium oxide film, challenges related to irregular or blunt tip shape can be overcome. However, complete characterization of structure, shape and chemical composition is required before useful information can be obtained using the AFM.


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