Atomic-resolution studies of In2O3-ZnO compounds on aberration-corrected electron microscopes

2009 ◽  
pp. 169-170
Author(s):  
Wentao Yu ◽  
Lothar Houben ◽  
Karsten Tillmann ◽  
Werner Mader
Keyword(s):  
Atomic Resolution ◽  
Electron Microscopes ◽  
Aberration Corrected

Still “Plenty of Room at the Bottom” for Aberration-Corrected TEM

2011 ◽  
Vol 19 (3) ◽  
pp. 10-14 ◽  
Author(s):  
Joerg R. Jinschek ◽  
Emrah Yucelen ◽  
Bert Freitag ◽  
Hector A. Calderon ◽  
Andy Steinbach
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Atomic Resolution ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Exciting Time ◽  
The Individual ◽  
Richard Feynman ◽  
Everyday Reality ◽  
Aberration Corrected

In his now-famous 1959 speech on nanotechnology, Richard Feynman proposed that it should be possible to see the individual atoms in a material, if only the electron microscope could be made 100 times better. With the development of aberration correctors on transmission electron microscopes (TEMs) over the last decade, this dream of microscopists to directly image structures atom-by-atom has come close to an everyday reality. Figure 1 shows such a high-resolution transmission electron microscope (HR-TEM) image of a single-wall carbon nanotube obtained with an aberration-corrected TEM. Now that atomic-resolution images have become possible with aberration-corrector technology in both TEM and STEM, we can ask ourselves if we truly have achieved the goal of seeing individual atoms. Most aberration-corrected images exhibiting atomic resolution are not distinguishing individual atoms, but columns of a small number of atoms, so despite this remarkable achievement, there is still “plenty of room at the bottom” in order to move toward seeing, counting, and quantifying individual atoms. In fact, there never has been a more exciting time for electron microscopists.

scholarly journals Data Processing for Atomic Resolution Electron Energy Loss Spectroscopy

2012 ◽  
Vol 18 (4) ◽  
pp. 667-675 ◽  
Author(s):  
Paul Cueva ◽  
Robert Hovden ◽  
Julia A. Mundy ◽  
Huolin L. Xin ◽  
David A. Muller
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Principal Component ◽  
Power Laws ◽  
Atomic Resolution ◽  
Background Error ◽  
Background Estimation ◽  
Electron Microscopes ◽  
Electron Energy Loss

AbstractThe high beam current and subangstrom resolution of aberration-corrected scanning transmission electron microscopes has enabled electron energy loss spectroscopy (EELS) mapping with atomic resolution. These spectral maps are often dose limited and spatially oversampled, leading to low counts/channel and are thus highly sensitive to errors in background estimation. However, by taking advantage of redundancy in the dataset map, one can improve background estimation and increase chemical sensitivity. We consider two such approaches—linear combination of power laws and local background averaging—that reduce background error and improve signal extraction. Principal component analysis (PCA) can also be used to analyze spectrum images, but the poor peak-to-background ratio in EELS can lead to serious artifacts if raw EELS data are PCA filtered. We identify common artifacts and discuss alternative approaches. These algorithms are implemented within the Cornell Spectrum Imager, an open source software package for spectroscopic analysis.

scholarly journals Aberration Corrected STEM in Atomic Resolution and Resolution Enhancement in Low-Voltage Microscope

Hyomen Kagaku ◽  
2013 ◽  
Vol 34 (5) ◽  
pp. 240-246
Author(s):  
Hidetaka SAWADA ◽  
Takeo SASAKI ◽  
Eiji OKUNISHI ◽  
Kazutomo SUENAGA
Keyword(s):  
Low Voltage ◽  
Resolution Enhancement ◽  
Atomic Resolution ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

scholarly journals Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
Xiahan Sang ◽  
Andrew R. Lupini ◽  
Jilai Ding ◽  
Sergei V. Kalinin ◽  
Stephen Jesse ◽  
...  
Keyword(s):  
Linear Velocity ◽  
Atomic Resolution ◽  
Characteristic Functions ◽  
Precise Control ◽  
Spiral Scanning ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Spiral Scan ◽  
Aberration Corrected

Abstract Atomic-resolution imaging in an aberration-corrected scanning transmission electron microscope (STEM) can enable direct correlation between atomic structure and materials functionality. The fast and precise control of the STEM probe is, however, challenging because the true beam location deviates from the assigned location depending on the properties of the deflectors. To reduce these deviations, i.e. image distortions, we use spiral scanning paths, allowing precise control of a sub-Å sized electron probe within an aberration-corrected STEM. Although spiral scanning avoids the sudden changes in the beam location (fly-back distortion) present in conventional raster scans, it is not distortion-free. “Archimedean” spirals, with a constant angular frequency within each scan, are used to determine the characteristic response at different frequencies. We then show that such characteristic functions can be used to correct image distortions present in more complicated constant linear velocity spirals, where the frequency varies within each scan. Through the combined application of constant linear velocity scanning and beam path corrections, spiral scan images are shown to exhibit less scan distortion than conventional raster scan images. The methodology presented here will be useful for in situ STEM imaging at higher temporal resolution and for imaging beam sensitive materials.

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