Atom-Resolved STEM Imaging Using a Segmented Detector

Author(s):  
Takehito Seki ◽  
Gabriel Sanchez-Santolino ◽  
Nathan Lugg ◽  
Ryo Ishikawa ◽  
Scott D. Findlay ◽  
...  
Keyword(s):  
2019 ◽  
Vol 202 ◽  
pp. 148-155 ◽  
Author(s):  
Kousuke Ooe ◽  
Takehito Seki ◽  
Yuichi Ikuhara ◽  
Naoya Shibata

2017 ◽  
Vol 182 ◽  
pp. 258-263 ◽  
Author(s):  
Takehito Seki ◽  
Gabriel Sánchez-Santolino ◽  
Ryo Ishikawa ◽  
Scott D. Findlay ◽  
Yuichi Ikuhara ◽  
...  

2010 ◽  
Vol 16 (S2) ◽  
pp. 760-761
Author(s):  
Y Kohno ◽  
N Shibata ◽  
H Sawada ◽  
SD Findlay ◽  
Y Kondo ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.


2003 ◽  
Vol 104 ◽  
pp. 529-534 ◽  
Author(s):  
M. Feser ◽  
C. Jacobsen ◽  
P. Rehak ◽  
G. DeGeronimo

2000 ◽  
Vol 27 (5) ◽  
pp. 1174-1184 ◽  
Author(s):  
Grant M. Stevens ◽  
Norbert J. Pelc
Keyword(s):  
X Ray ◽  

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