Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1–2 nm by Focused Ion Beam Milling

2015 ◽  
Vol 27 (19) ◽  
pp. 3002-3006 ◽  
Author(s):  
Ajuan Cui ◽  
Zhe Liu ◽  
Huanli Dong ◽  
Yujin Wang ◽  
Yonggang Zhen ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Break Junction ◽  
Single Grain ◽  
Nanogap Electrodes ◽  
Focused Ion Beam Milling

Influence of Domain Structure on Magnetoresistance in Perovskite Manganite Grain Boundary Junctions

2001 ◽  
Vol 674 ◽  
Author(s):  
Robert Gunnarsson ◽  
Anatoli Kadigrobov ◽  
Zdravko Ivanov
Keyword(s):  
Grain Boundary ◽  
Temperature Dependence ◽  
Focused Ion Beam ◽  
Domain Walls ◽  
Ion Beam ◽  
Perovskite Manganite ◽  
Current Voltage ◽  
Single Grain ◽  
Current Voltage Characteristics ◽  
The Impact

ABSTRACTWe have been able to deduce a temperature dependence of the built-in potential in La2/3Sr1/3MnO3 grain boundary junctions. This has been performed by trimming a single grain boundary down to 1μm width with a focused ion-beam. We can thereby see the impact of single domain walls on the magnetoresistance and the current-voltage characteristics. We have also demonstrated the effect of averaging as we increased the number of junctions.

Measuring Local Mechanical Properties using FIB Machined Cantilevers

2009 ◽  
Vol 1185 ◽  
Author(s):  
David Edward John Armstrong ◽  
Angus Jonathan Wilkinson ◽  
Steve George Roberts
Keyword(s):  
Grain Boundary ◽  
Single Crystal ◽  
Focused Ion Beam ◽  
Size Dependence ◽  
Ion Beam ◽  
Polycrystalline Copper ◽  
Sharp Notch ◽  
Single Grain ◽  
Bismuth Alloy ◽  
Good Agreement

AbstractMicro-scale Focused Ion Beam (FIB) machined cantilevers were manufactured in single crystal copper, polycrystalline copper and a copper-bismuth alloy. These were imaged and tested in bending using a nanoindenter. Cantilevers machined inside a single grain of polycrystalline copper were tested to determine their (anisotropic) Young's modulus: results were in good agreement with values calculated from literature values for single crystal elastic constants. The size dependence of yield behavior in the Cu microcantilevers was also investigated. As the thickness of the specimen was reduced from 23μm to 1.7μm the yield stress increased from 300MPa to 900MPa. Microcantilevers in Cu-0.02%Bi were manufactured containing a single grain boundary of known character, with a FIB-machined sharp notch on the grain boundary. The cantilevers were loaded to fracture allowing the fracture toughness of grain boundaries of different misorientations to be determined.

scholarly journals Thermal induced single grain boundary break junction for suspended nanogap electrodes

2015 ◽  
Vol 58 (10) ◽  
pp. 769-774 ◽  
Author(s):  
Ajuan Cui ◽  
Zhe Liu ◽  
Huanli Dong ◽  
Yujin Wang ◽  
Yonggang Zhen ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Break Junction ◽  
Single Grain ◽  
Nanogap Electrodes

Experimental Measurements of Grain Boundary Rotation Toward Bamboo in Post-Pattern Annealing

1996 ◽  
Vol 428 ◽  
Author(s):  
D. L. Barr ◽  
W. L. Brown ◽  
M. Ohring
Keyword(s):  
Grain Boundary ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Experimental Measurements ◽  
Statistical Distributions ◽  
Before And After ◽  
Boundary Rotation ◽  
Inclination Angles ◽  
Single Grain ◽  
Line Direction

AbstractThe microstructure of 0.8.µm, A1(0.5% Cu) lines has been measured both before and after post-pattern annealing in nitrogen at various times and temperatures. Grain boundary inclinations in single grain segments of lines were determined from Focused Ion Beam (FIB) images of two surfaces of the lines. The statistical distributions of inclination angles before and after annealing reveal the tendency for boundaries to rotate to reduce their area. In these experiments the rotation stagnates with the normals to the grain boundaries having a distribution of inclinations with a FWHM of about 33 degrees around the line direction.

scholarly journals A streamlined workflow for automated cryo focused ion beam milling

2021 ◽  
pp. 107743
Author(s):  
Sebastian Tacke ◽  
Philipp Erdmann ◽  
Zhexin Wang ◽  
Sven Klumpe ◽  
Michael Grange ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Focused Ion Beam Milling

Addressable Metal-Ferroelectric-Metal Nanocapacitor Arrays Fabricated by Focused Ion Beam Milling

2012 ◽  
Vol 132 (1) ◽  
pp. 99-106
Author(s):  
Ying Dai ◽  
Lei Yang ◽  
Longhai Wang ◽  
Bin Tian ◽  
Lianying Zou ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Focused Ion Beam Milling

A study of angular effects in focused ion beam milling of water ice

2008 ◽  
Vol 18 (9) ◽  
pp. 095010 ◽  
Author(s):  
Jing Fu ◽  
Sanjay B Joshi ◽  
Jeffrey M Catchmark
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Water Ice ◽  
Focused Ion Beam Milling
Sign in / Sign up

Export Citation Format

Share Document