Device Fabrication Based on Oxidative Chemical Vapor Deposition (oCVD) Synthesis of Conducting Polymers and Related Conjugated Organic Materials

2018 ◽  
Vol 6 (1) ◽  
pp. 1801564 ◽  
Author(s):  
Meysam Heydari Gharahcheshmeh ◽  
Karen K. Gleason
1995 ◽  
Vol 13 (4) ◽  
pp. 2142-2145 ◽  
Author(s):  
Masako Yudasaka ◽  
Rie Kikuchi ◽  
Takeo Matsui ◽  
Kouji Tasaka ◽  
Yoshimasa Ohki ◽  
...  

1988 ◽  
Vol 116 ◽  
Author(s):  
Jack P. Salerno ◽  
D. S. Hill ◽  
J. W. Lee ◽  
R. E. McCullough ◽  
John C. C. Fan

AbstractThe growth of high-quality single crystal GaAs on Si wafers up to six inches in diameter by organometallic chemical vapor deposition (OMCVD) is reported. These wafers have specular surfaces, excellent thickness uniformity, and are shown to have properties comparable to those of smaller diameter GaAs on Si wafers. The mechanical and electrical properties of the six inch GaAs on Si wafers are shown to be suitable for GaAs device fabrication.


1991 ◽  
Vol 224 ◽  
Author(s):  
K. H. Jung ◽  
T. Y. Hsieh ◽  
D. L. Kwong

AbstractRapid thermal processing chemical vapor deposition (RTP-CVD) has received considerable attention as a novel in-situ multi-processing tool capable of meeting the stringent requirements of ULSI device fabrication. In this paper, we review the progress made in developing and applying RTP-CVD to ULSI device fabrication. Research areas discussed include epitaxial Si and poly-Si growth, in-situ doping, selective growth, in-situ multi-processing, and novel dielectrics. In addition, the extension of RTP-CVD to novel materials such as GexSi1−x has produced device quality films with successful application in HBTs and Si-based optoelectronics.


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