Impact of order of catalytic ethylene and propylene polymerization on nanometer scale isotactic polypropylene‐polyethylene blend morphology in nascent heterophasic granules revealed by low voltage scanning electron microscopy and scanning transmission electron microscopy

2021 ◽  
pp. 51938
Author(s):  
Patrick Brant ◽  
Gary M. Brown ◽  
Andrew Narvaez
Keyword(s):  
Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Low Voltage ◽  
Propylene Polymerization ◽  
Nanometer Scale ◽  
Blend Morphology ◽  
Polyethylene Blend ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Voltage Scanning

Imaging with low-voltage scanning transmission electron microscopy: A quantitative analysis

2011 ◽  
Vol 111 (8) ◽  
pp. 1018-1028 ◽  
Author(s):  
L. Felisari ◽  
V. Grillo ◽  
F. Jabeen ◽  
S. Rubini ◽  
C. Menozzi ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Quantitative Analysis ◽  
Scanning Transmission Electron Microscopy ◽  
Low Voltage ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Voltage Scanning

Enhanced Atomic-Scale Imaging of PGM-Free Catalysts By Low-Voltage Scanning Transmission Electron Microscopy

2020 ◽  
Vol MA2020-02 (33) ◽  
pp. 2126-2126
Author(s):  
Michael J. Zachman ◽  
Dong Young Chung ◽  
Edward F. Holby ◽  
Vojislav R. Stamenkovic ◽  
David A. Cullen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Low Voltage ◽  
Atomic Scale ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Voltage Scanning

High-Voltage Scanning Electron Microscopy

1970 ◽  
Vol 28 ◽  
pp. 6-7
Author(s):  
J. M. Cowley
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Wave Optics ◽  
Contrast Effects ◽  
Transmission Electron ◽  
Mode Of Operation ◽  
Scanning Transmission ◽  
Types Of Information ◽  
Voltage Scanning

The comparison of scanning transmission electron microscopy (STEM) with conventional transmission electron microscopy (CTEM) can best be made by means of the Reciprocity Theorem of wave optics. In Fig. 1 the intensity measured at a point A’ in the CTEM image due to emission from a point B’ in the electron source is equated to the intensity at a point of the detector, B, due to emission from a point A In the source In the STEM. On this basis it can be demonstrated that contrast effects In the two types of instrument will be similar. The reciprocity relationship can be carried further to include the Instrument design and experimental procedures required to obtain particular types of information. For any. mode of operation providing particular information with one type of microscope, the analagous type of operation giving the same information can be postulated for the other type of microscope. Then the choice between the two types of instrument depends on the practical convenience for obtaining the required Information.

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