Kelvin Probe Force Microscopy Study of a Pt/TiO2Catalyst Model Placed in an Atmospheric Pressure of N2Environment

Chemistry - An Asian Journal ◽

10.1002/asia.201101001 ◽

2012 ◽

Vol 7 (6) ◽

pp. 1251-1255 ◽

Author(s):

Ryohei Kokawa ◽

Masahiro Ohta ◽

Akira Sasahara ◽

Hiroshi Onishi

Keyword(s):

Atmospheric Pressure ◽

Microscopy Study ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Kelvin probe force microscopy study on operating In-Sn-O-channel ferroelectric-gate thin-film transistors

Journal of Applied Physics ◽

10.1063/1.4866597 ◽

2014 ◽

Vol 115 (10) ◽

pp. 104501

Author(s):

P. T. Tue ◽

T. Miyasako ◽

E. Tokumitsu ◽

T. Shimoda

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Microscopy Study ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Inside Front Cover: Quantitative Measurement of the Local Surface Potential of π-Conjugated Nanostructures: A Kelvin Probe Force Microscopy Study (Adv. Funct. Mater. 11/2006)

Advanced Functional Materials ◽

10.1002/adfm.200690041 ◽

2006 ◽

Vol 16 (11) ◽

pp. NA-NA

Author(s):

A. Liscio ◽

V. Palermo ◽

D. Gentilini ◽

F. Nolde ◽

K. Müllen ◽

...

Keyword(s):

Surface Potential ◽

Quantitative Measurement ◽

Microscopy Study ◽

Kelvin Probe Force Microscopy ◽

Local Surface ◽

Kelvin Probe ◽

Front Cover ◽

Force Microscopy

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Kelvin probe force microscopy study of surface potential transients in cleaved AlGaN∕GaN high electron mobility transistors

Applied Physics Letters ◽

10.1063/1.2743383 ◽

2007 ◽

Vol 90 (21) ◽

pp. 213511 ◽

Author(s):

S. Kamiya ◽

M. Iwami ◽

T. Tsuchiya ◽

M. Kurouchi ◽

J. Kikawa ◽

...

Keyword(s):

Surface Potential ◽

Electron Mobility ◽

High Electron Mobility Transistors ◽

Microscopy Study ◽

Kelvin Probe Force Microscopy ◽

High Electron ◽

Kelvin Probe ◽

High Electron Mobility ◽

Force Microscopy ◽

Electron Mobility Transistors

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Kelvin Probe Force Microscopy Study of Conjugated Polymer/Fullerene Organic Solar Cells

Japanese Journal of Applied Physics ◽

10.1143/jjap.44.5370 ◽

2005 ◽

Vol 44 (7B) ◽

pp. 5370-5373 ◽

Author(s):

Thilo Glatzel ◽

Harald Hoppe ◽

Niyazi S. Sariciftci ◽

Martha Ch. Lux-Steiner ◽

Masaharu Komiyama

Keyword(s):

Solar Cells ◽

Organic Solar Cells ◽

Conjugated Polymer ◽

Microscopy Study ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Kelvin Probe Force Microscopy Study of the Electrostatic System of the Crystal Surface of AuNi/GaN Schottky Diodes

Semiconductors ◽

10.1134/s1063782620030185 ◽

2020 ◽

Vol 54 (3) ◽

pp. 337-344

Author(s):

N. A. Torkhov ◽

V. A. Novikov

Keyword(s):

Crystal Surface ◽

Schottky Diodes ◽

Microscopy Study ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Electrostatic System

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A Kelvin Probe Force Microscopy Study of the Photogeneration of Surface Charges in All-Thiophene Photovoltaic Blends

Advanced Functional Materials ◽

10.1002/adfm.200600122 ◽

2007 ◽

Vol 17 (3) ◽

pp. 472-478 ◽

Author(s):

V. Palermo ◽

G. Ridolfi ◽

A. M. Talarico ◽

L. Favaretto ◽

G. Barbarella ◽

...

Keyword(s):

Microscopy Study ◽

Kelvin Probe Force Microscopy ◽

Surface Charges ◽

Kelvin Probe ◽

Force Microscopy

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Electronic properties of dioctylterthiophene-based organic thin-film transistors: A Kelvin probe force microscopy study

Thin Solid Films ◽

10.1016/j.tsf.2013.04.010 ◽

2013 ◽

Vol 536 ◽

pp. 295-301 ◽

Author(s):

N. Afsharimani ◽

B. Nysten

Keyword(s):

Thin Film ◽

Electronic Properties ◽

Thin Film Transistors ◽

Microscopy Study ◽

Organic Thin Film Transistors ◽

Kelvin Probe Force Microscopy ◽

Organic Thin Film ◽

Kelvin Probe ◽

Force Microscopy

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Scanning Kelvin probe force microscopy study of chromium nitrides in 2507 super duplex stainless steel—Implications and limitations

Electrochimica Acta ◽

10.1016/j.electacta.2010.08.038 ◽

2011 ◽

Vol 56 (4) ◽

pp. 1792-1798 ◽

Author(s):

Namurata Sathirachinda ◽

Rachel Pettersson ◽

Sten Wessman ◽

Ulf Kivisäkk ◽

Jinshan Pan

Keyword(s):

Stainless Steel ◽

Duplex Stainless Steel ◽

Microscopy Study ◽

Kelvin Probe Force Microscopy ◽

Super Duplex Stainless Steel ◽

Kelvin Probe ◽

Force Microscopy ◽

Chromium Nitrides ◽

Scanning Kelvin Probe

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Photocatalytic activity of nitrogen-doped TiO2-based nanowires: a photo-assisted Kelvin probe force microscopy study

Journal of Nanoparticle Research ◽

10.1007/s11051-013-2143-y ◽

2013 ◽

Vol 16 (1) ◽

Author(s):

Ming-Chung Wu ◽

Hsueh-Chung Liao ◽

Yu-Cheng Cho ◽

Che-Pu Hsu ◽

Ting-Han Lin ◽

...

Keyword(s):

Photocatalytic Activity ◽

Microscopy Study ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

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Influence of Molecular Order on the Local Work Function of Nanographene Architectures: A Kelvin-Probe Force Microscopy Study

ChemPhysChem ◽

10.1002/cphc.200500181 ◽

2005 ◽

Vol 6 (11) ◽

pp. 2371-2375 ◽

Author(s):

Vincenzo Palermo ◽

Matteo Palma ◽

Željko Tomović ◽

Mark D. Watson ◽

Rainer Friedlein ◽

...

Keyword(s):

Work Function ◽

Microscopy Study ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Molecular Order ◽

Force Microscopy ◽

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